Browsing by Author Cheng, YC

Jump to: 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
Showing results 3 to 22 of 109 < previous   next >
TitleAuthor(s)Issue DateViews
 
1998
117
 
An analysis on stress-induced degradation of 1/f noise in n-MOSFETs
Proceeding/Conference:Proceedings of 15th International Conference Noise in Physical Systems and 1/f Fluctuations
1999
18
 
1984
96
 
1984
47
 
2012
110
 
2006
40
 
2008
137
 
2009
57
 
Characterisation and simulation of substrate current in thermally reoxidised-nitrided-oxide n-MOSFET's
Proceeding/Conference:International Semiconductor Device Research Symposium, ISDRS-91
1991
32
 
1990
157
 
1990
102
 
2000
188
 
2002
180
 
1994
156
 
1985
127
 
A comparison between NO-annealed O2- and N2O-grown gate dielectrics
Proceeding/Conference:IEEE Hong Kong Electron Devices Meeting Proceedings
1998
112
 
1998
97
 
Computer simulation of rapid thermal annealing of thermally grown oxide in ammonia ambient
Proceeding/Conference:Techical Digest of 1989 International Conference on VLSI and CAD (ICVC '89)
1989
16
 
1998
363
 
1993
154