Showing results 8 to 16 of 16
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| Title | Author(s) | Issue Date | Views | |
|---|---|---|---|---|
A novel design of grating projection system for 3D reconstruction of wafer bumps Proceeding/Conference:Proceedings of SPIE - The International Society for Optical Engineering | 2006 | 129 | ||
Optimization of bit-pairing codification with learning for 3D reconstruction Journal:International Journal of Image and Graphics | 2007 | 111 | ||
Projection optics design for tilted projection of fringe patterns Journal:Optical Engineering | 2008 | 198 | ||
Reference-free detection of semiconductor assembly defect Proceeding/Conference:Proceedings of SPIE - The International Society for Optical Engineering | 2005 | 185 | ||
Reference-free machine vision inspection of semiconductor die images Journal:International Journal of Image and Graphics | 2009 | 154 | ||
Structured light-based 3D reconstruction for device with a tiny size Proceeding/Conference:European Conference on Computer Vision's 2nd Workshop on Applications of Computer Vision | 2006 | 99 | ||
Surface orientation recovery of specular micro-surface via binary pattern projection Proceeding/Conference:Proceedings of SPIE - The International Society for Optical Engineering | 2006 | 190 | ||
Three-dimensional reconstruction of wafer solder bumps using binary pattern projection Proceeding/Conference:Proceedings of SPIE - The International Society for Optical Engineering | 2005 | 200 | ||
Use of paraplanar constraint for parallel inspection of wafer bump heights Proceeding/Conference:International Conference on Image Processing, Computer Vision, and Pattern Recognition, IPCV 2007 | 2007 | 87 |