Showing results 19 to 23 of 23
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Title | Author(s) | Issue Date | Views | |
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A novel MONOS memory with high-κ HfLaON as charge-storage layer Journal:IEEE Transactions on Device and Materials Reliability | 2011 | 178 | ||
2014 | 80 | |||
2007 | 115 | |||
2012 | 62 | |||
Variational inference for cognitive diagnosis models Proceeding/Conference:The Annual Meeting of the National Council on Measurement in Education (NCME), Virtual Meeting, 2020 | 2020 | 42 |