Browsing by Author Ma, ZJ

Jump to: 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z 中
Showing results 1 to 15 of 15
TitleAuthor(s)Issue DateViews
 
Characterisation and simulation of substrate current in thermally reoxidised-nitrided-oxide n-MOSFET's
Proceeding/Conference:International Semiconductor Device Research Symposium, ISDRS-91
Ma, ZJLai, PTLiu, ZHCheng, YC
1991
44
 
Deep-depletion-layer impact-ionization-induced gate-oxide breakdown in thin-oxide n-MOSFETs
Journal:Solid-State Electronics
Huang, MQLai, PTMa, ZJWong, HCheng, YC
1993
 
Effects of hole trapping on degradation behaviors in thermally-nitrided oxides under F-N injection
Proceeding/Conference:Proceedings of the 3rd International Conference on Solid State and Integrated Circuit Technology
Lai, PTMa, ZJCheng, YCLiu, BYHuang, MQ
1992
38
 
Effects of nitridation and re-oxidation on drain leakage current in n-channel MOSFETs
Proceeding/Conference:Conference on Solid State Devices and Materials
Fleischer, SLiu, ZHLai, PTMa, ZJCheng, YC
1990
 
Electrical characterization and simulation of substrate current in n-MOSFETs with nitrided/reoxidized-nitrided oxides as gate dielectrics
Journal:Solid-State Electronics
Ma, ZJLai, PTCheng, YC
1992
172
 
Hot-carrier-induced degradation in reoxidized-nitrided-oxide n-MOSFET's under mixed AC-DC stressing
Journal:Electron device letters
Ma, ZJLai, PTCheng, YC
1992
 
Impact of nitridation/reoxidation on performance degradation in n-MOSFETs under Fowler-Nordheim injection
Journal:Solid-State Electronics
Ma, ZJLiu, ZHLai, PTFleischer, SCheng, YC
1992
159
 
Improvement of channel-current-induced gate-oxide breakdown in n-MOSFET's using rapid thermal nitridation
Proceeding/Conference:Proceedings of the 3rd International Conference on Solid State and Integrated Circuit Technology
Huang, MQLai, PTMa, ZJCheng, YCLiu, BY
1992
 
Improvement of punchthrough-induced gate-oxide breakdown in n-channel metal-oxide-semiconductor field-effect transistors using rapid thermal nitridation
Journal:Applied Physics Letters
Huang, MQLai, PTMa, ZJWong, HCheng, YC
1992
 
Instability in GIDL current of thermally-nitrided-oxide n-MOSFET's
Proceeding/Conference:International Conference on VLSI and CAD Proceedings
Ma, ZJLai, PTCheng, YCHuang, MQ
1991
41
 
Off-state instabilities in thermally nitrided-oxide n-MOSFETs
Journal:IEEE Transactions on Electron Devices
Ma, ZJLai, PTCheng, YC
1993
56
 
On recovery of hot-carrier-induced mobility degradationin off-state thermally-nitrided-oxide N-MOSFET's
Proceeding/Conference:Proceedings of the 3rd International Conference on Solid State and Integrated Circuit Technology
Ma, ZJLai, PTHuang, MQCheng, YCLiu, BY
1992
39
 
Oxide-trap-induced instability in GIDL of thermally nitrided-oxide N-MOSFET's under stress
Journal:Electron device letters
Ma, ZJLai, Pui TCheng, YC
1992
122
 
The Migratory Beekeeping Routing Problem: Model and an Exact Algorithm
Journal:INFORMS Journal on Computing
Ma, ZJYang, FDai, YShen, ZJM
2021
20
 
Tunneling-injection-induced turnaround behavior of threshold voltage in thermally nitrided oxide n-channel metal-oxide-semiconductor field-effect transistors
Journal:Journal of Applied Physics
Ma, ZJLai, PTLiu, ZHFleischer, SCheng, YC
1990
205
Showing results 1 to 15 of 15