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Showing results 3 to 16 of 16 < previous

	Title	Author(s)	Issue Date	Views
	Depth profiling of Si nanocrystals in Si-implanted SiO2 films by spectroscopic ellipsometry Journal:Applied Physics Letters	Chen, TP Liu, Y Tse, MS Ho, PF Dong, G Fung, S	2003	170
	Depth Profiling of Si Oxidation States in Si-Implanted SiO 2 Films by X-Ray Photoelectron Spectroscopy Journal:Japanese Journal of Applied Physics, Part 2: Letters	Liu, Y Fu, YQ Chen, TP Tse, MS Fung, S Hsieh, JH Yang, XH	2003	61
	Influence of interfacial nitrogen on edge charge trapping at the interface of gate oxide/drain extension in metal-oxide-semiconductor transistors Journal:Applied Physics Letters	Chen, TP Huang, JY Tse, MS Tan, SS Ang, CH Fung, S	2003	164
	Influence of Si nanocrystal distributed in the gate oxide on the MOS capacitance Journal:IEEE Transactions on Electron Devices	Ng, CY Chen, TP Ding, L Yang, M Wong, JI Zhao, P Yang, XH Liu, KY Tse, MS Trigg, AD Fung, S	2006	121
	Influence of Si-nanocrystal distribution in the oxide on the charging behavior of MOS structures Journal:IEEE Transactions on Electron Devices	Liu, Y Chen, TP Ng, CY Ding, L Tse, MS Fung, S Tseng, AA	2006	147
	Influence of silicon-nanocrystal distribution in SiO2 matrix on charge injection and charge decay Journal:Applied Physics Letters	Ng, CY Chen, TP Tse, MS Lim, VSW Fung, S Tseng, AA	2005	177
	Modeling the post-breakdown I-V characteristics of ultrathin SiO 2 films with multiple snapbacks Journal:Japanese Journal of Applied Physics, Part 2: Letters	Chen, T Tse, MS Fung, S	2001	53
	On the switching behaviour of post-breakdown conduction in ultra-thin SiO 2 films Journal:Semiconductor Science and Technology	Chen, TP Tse, MS Zeng, X Fung, S	2001	47
	Post-breakdown conduction instability of ultrathin SiO 2 films observed in ramped-current and ramped-voltage current-voltage measurements Journal:Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers	Chen, TP Tse, MS Sun, CQ Fung, S	2002	55
	Profile of optical constants of SiO 2 thin films containing Si nanocrystals Journal:Journal of Applied Physics	Chen, TP Liu, Y Tse, MS Fung, S Dong, G	2004	160
	Random capacitance modulation due to charging/discharging in Si nanocrystals embedded in gate dielectric Journal:Nanotechnology	Liu, Y Chen, TP Ng, CY Tse, MS Zhao, P Fu, YQ Zhang, S Fung, S	2005	190
	Reactivity of Ru(OAc)2(Ph3P)2 toward chelating diphosphine ligands. X-ray crystal structures of fac-Ru(OAc)2(Ph3P) (dppm) and trans-Ru(OAc)2(P2N2H4) Journal:Polyhedron	Wong, WK Lai, KK Tse, MS Tse, MC Gao, JX Wong, WT Chan, S	1994	163
	Snapback behaviour and its similarity to the switching behaviour in ultra-thin silicon dioxide films after hard breakdown Journal:Journal of Physics D: Applied Physics	Chen, TP Tse, MS Sun, CQ Fung, S Lo, KF	2001	163
	Static dielectric constant of isolated silicon nanocrystals embedded in a SiO 2 thin film Journal:Applied Physics Letters	Ng, CY Chen, TP Ding, L Liu, Y Tse, MS Fung, S Dong, ZL	2006	169

Showing results 3 to 16 of 16 < previous