Browsing by Author XU, JP

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Showing results 51 to 58 of 58 < previous 
TitleAuthor(s)Issue DateViews
 
2016
44
 
2015
60
 
2015
74
 
A simplified post-soft-breakdown current model for MOS devices
Journal:Applied Physics A: Materials Science and Processing
2009
135
 
Suppressed growth of interlayer GeO x in Ge MOS capacitors with gate dielectric prepared in wet NO ambient
Proceeding/Conference:IEEE Conference on Electron Devices and Solid-State Circuits (EDSSC) Proceedings
2005
189
 
2019
7
 
2007
119
Threshold voltage model of SiGe channel pMOSFET without Si cap layer
Proceeding/Conference:2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC
2006
120