Showing results 4 to 5 of 5
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| Title | Author(s) | Issue Date | Views | |
|---|---|---|---|---|
Gate leakage properties of MOS devices with tri-layer high-k gate dielectric Journal:Microelectronics Reliability | 2007 | 77 | ||
Gate leakage properties of MOS devices with TriLayer high-k gate dielectric Proceeding/Conference:2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC | 2006 | 90 |