Showing results 4 to 6 of 6
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Title | Author(s) | Issue Date | Views | |
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Depth Profiling of Si Oxidation States in Si-Implanted SiO 2 Films by X-Ray Photoelectron Spectroscopy Journal:Japanese Journal of Applied Physics, Part 2: Letters | 2003 | 73 | ||
Influence of Si nanocrystal distributed in the gate oxide on the MOS capacitance Journal:IEEE Transactions on Electron Devices | 2006 | 127 | ||
Telomerase activation in nasopharyngeal carcinomas Journal:British Journal of Cancer | 1998 | 204 |