Browsing by Author Zeng, X

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TitleAuthor(s)Issue DateViews
 
2009
91
 
Interface-state-induced degradation of GIDL current in n-MOSFETsunder hot-carrier stress
Proceeding/Conference:Proceedings of the IEEE Hong Kong Electron Devices Meeting
1996
68
 
2016
39
 
2012
126
 
Malocclusions in Xia Dynasty in China
Journal:Chinese Medical Journal
2012
122
New observation and improvement in GIDL current of N-MOSFET's with various kinds of gate oxides under hot-carrier stress
Proceeding/Conference:IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE
1997
61
 
1996
113
 
1996
119
 
1995
82
 
1995
107
 
2001
44
 
2011
64
 
2011
93
 
2019
1
 
2002
49
 
2019
8
 
The Urbanization Process and Mechanism
Book:The Geographical Sciences During 1986—2015: From the Classics to the Frontiers
2016
10
 
2010
101
 
2010
76