Browsing by Author Zeng, X

Jump to: 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
Showing results 11 to 30 of 39 < previous   next >
TitleAuthor(s)Issue DateViews
 
2010
Effects of backsurface Ar+ bombardment on n-MOSFET's with nitride gate oxides
Proceeding/Conference:IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE
1997
44
 
1998
61
 
2010
 
2012
44
 
2013
79
 
2018
2
 
1996
87
 
2009
84
 
2010
61
 
2009
91
 
Interface-state-induced degradation of GIDL current in n-MOSFETsunder hot-carrier stress
Proceeding/Conference:Proceedings of the IEEE Hong Kong Electron Devices Meeting
1996
68
 
2016
39
 
2012
126
 
Malocclusions in Xia Dynasty in China
Journal:Chinese Medical Journal
2012
122
New observation and improvement in GIDL current of N-MOSFET's with various kinds of gate oxides under hot-carrier stress
Proceeding/Conference:IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE
1997
61
 
1996
113
 
1996
119
 
1995
82
 
1995
107