Browsing by Author Zeng, X

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TitleAuthor(s)Issue DateViews
Effects of backsurface Ar+ bombardment on n-MOSFET's with nitride gate oxides
Proceeding/Conference:IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE
1997
52
 
1998
106
 
2010
87
 
2012
74
 
2013
93
 
2018
23
 
1996
84
 
2009
140
 
2010
73
 
2009
119
 
Interface-state-induced degradation of GIDL current in n-MOSFETsunder hot-carrier stress
Proceeding/Conference:Proceedings of the IEEE Hong Kong Electron Devices Meeting
1996
66
 
2016
95
 
2012
77
 
Malocclusions in Xia Dynasty in China
Journal:Chinese Medical Journal
2012
128
New observation and improvement in GIDL current of N-MOSFET's with various kinds of gate oxides under hot-carrier stress
Proceeding/Conference:IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE
1997
68
 
1996
107
 
1996
65
 
1995
71
 
1995
103
 
2001
69