Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2008
120
 
2005
93
 
2002
102
 
1993
73
 
2009
102
 
1995
103
 
Characterization of optical and structural properties of Pt-Si interface by spectroscopic ellipsometry
Proceeding/Conference:Proceedings of the 22nd International Conference on the Physics of Semiconductors, Canada
1994
63
 
1994
95
 
2010
68
 
2007
92
 
2008
78
 
2006
103
 
2004
108
 
2006
97
 
2009
130
 
2009
113
 
2011
85
 
2012
125
 
2004
121
 
1993
173