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Showing results 1 to 14 of 14

	Title	Author(s)	Issue Date	Views
	Accurate phase capacitance spectroscopy of transition metal silicon diodes Journal:Applied Physics Letters	Evans, HL Wu, X Yang, ES Ho, PS	1985	183
	Carrier confinement photoconductive detector Journal:Applied Physics Letters	Jalali, B Evans, HL Yang, ES	1988	159
	Determination of grain boundary barrier height and interface states by a focused laser beam Journal:Applied Physics Letters	Poon, E Yang, ES Evans, HL Hwang, W Osgood Jr, RM	1983	173
	Effect of Schottky barrier height on EL2 measurement by deep-level transient spectroscopy Journal:Journal of Applied Physics	Ma, QY Schmidt, MT Wu, X Evans, HL Yang, ES	1988	176
	Electronic Properties Of Grain Boundaries In Polycrystalline Silicon Proceeding/Conference:Proceedings of SPIE - The International Society for Optical Engineering	Yang, ES Poon, E Evans, HL Hwang, W Song, JS Wu, CM	1983	97
	Electronic states at silicide-silicon interfaces Journal:Physical Review Letters	Ho, PS Yang, ES Evans, HL Wu, X	1986	107
	Heterojunction bipolar transistor with separate carrier injection and confinement Journal:IEEE Transactions on Electron Devices	Luo, LF Evans, HL Yang, ES	1989	155
	An improved differential voltage technique for capacitance measurement Journal:Solid State Electronics	Wu, X Evans, HL Yang, ES	1988	113
	MEASUREMENT OF GRAIN BOUNDARY PARAMETERS BY LASER-SPOT PHOTOCONDUCTIVITY. Proceeding/Conference:Materials Research Society Symposia Proceedings	Poon, E Evans, HL Hwang, W Osgood Jr, RM Yang, ES	1983	90
	Measurement of interface states in palladium silicon diodes Journal:Journal of Applied Physics	Evans, HL Wu, X Yang, ES Ho, PS	1986	156
	Negative capacitance at metal-semiconductor interfaces Journal:Journal of Applied Physics	Wu, X Yang, ES Evans, HL	1990	173
	Photoconductance transient response in polycrystalline silicon Journal:Journal of Applied Physics	Poon, E Hwang, W Yang, ES Evans, HL	1985	172
	Reply to "comment on 'negative capacitance at metal-semiconductor interfaces'" [J. Appl. Phys. 70, 1090 (1991)] Journal:Journal of Applied Physics	Wu, X Evans, HL Yang, ES	1991	168
	Schottky barrier, electronic states and microstructure at Ni silicide-silicon interfaces Journal:Surface Science	Ho, PS Liehr, M Schmid, PE Legoues, FK Yang, ES Evans, HL Wu, X	1986	121

Showing results 1 to 14 of 14