Showing results 1 to 3 of 3
Title | Author(s) | Issue Date | Views | |
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Burnout and gate rupture of power MOS transistors with fission fragments of 252Cf Journal:Yuanzineng Kexue Jishu/Atomic Energy Science and Technology | 2000 | 126 | ||
2018 | 48 | |||
Rare earthquake response spectra for typical site conditions in Hong Kong Journal:HKIE Transactions | 2015 | 103 |