Browsing by Author Tse, MS

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Showing results 1 to 17 of 17
TitleAuthor(s)Issue DateViews
 
2004
189
 
2004
197
 
2003
178
 
2003
82
 
2020
8
 
2003
184
 
2006
128
 
2006
167
 
2005
176
 
2001
75
 
2001
68
 
Post-breakdown conduction instability of ultrathin SiO 2 films observed in ramped-current and ramped-voltage current-voltage measurements
Journal:Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
2002
63
 
2004
199
 
2005
200
 
1994
208
 
2001
178
 
2006
199