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Title	Author(s)	Issue Date	Views
Depth profiling of vacancy-type defects in homogenous and multilayered a-Si films by positron beam Doppler broadening Journal:Journal of Non-Crystalline Solids	Zou, X Webb, DP Chan, YC Lam, YW Hu, YF Gong, M Beling, CD Fung, S	1998	89
Effects of annealing gas on electrical properties and reliability of Ge MOS capacitors with HfTiON as gate dielectric Proceeding/Conference:IEEE Conference on Electron Devices and Solid-State Circuits 2007, EDSSC 2007	Li, CX Lai, PT Xu, JP Zou, X	2007	104
Effects of post deposited Annealing on Ge MOS capacitors with sub-nanometer EOT HfTiO gate dielectric Proceeding/Conference:IEEE International Conference of Nano/Micro Engineered and Molecular Systems (NEMS) Proceedings	Zou, X Xu, J Lai, PT Li, C	2008	63
Effects of Ti content and wet-N2 anneal on Ge MOS capacitors with HfTiO gate dielectric Journal:Microelectronics Reliability	Li, CX Zou, X Lai, PT Xu, JP Chan, CL	2008	124
Electrical characteristics of Al-doped ZnO-channel thin-film transistor with high-κ HfON/SiO 2 stack gate dielectric Proceeding/Conference:2010 IEEE International Conference of Electron Devices and Solid-State Circuits, EDSSC 2010	Zou, X Xu, JP Lai, PT Li, Y Ji, F Deng, LF	2010	99
Electrical Characteristics of Ge MOS Capacitor with HfTiON as Gate Dielectric Proceeding/Conference:Proceedings of RIUPEEEC	Zou, X Li, C Xu, JP Lai, PT Chen, WB	2006	53
Electrical properties of HfTiO gate-dielectric metal oxide semiconductor capacitors with NO and N 2O surface nitridations Proceeding/Conference:2010 IEEE International Conference of Electron Devices and Solid-State Circuits, EDSSC 2010	Ji, F Xu, JP Li, CX Lai, PT Deng, LF Zou, X	2010	76
Gate Leakage Model of Ge MOS Capacitor with High-k Gate Dielectric Proceeding/Conference:Proceedings of 8th ICSICT	Zou, X Xu, JP Lai, PT Li, C Zhang, XF	2006	71
Gate-leakage model of Ge MOS capacitor with high-k gate dielectric Proceeding/Conference:ICSICT-2006: 2006 8th International Conference on Solid-State and Integrated Circuit Technology, Proceedings	Zou, X Xu, JP Lai, PT Li, CX Zhang, XF	2007	96
Identification of vacancy-like defects in high-rate grown a-Si before and after ligh soaking by vepas Proceeding/Conference:Materials Research Society Symposium Proceedings	Zou, X Chan, YC Webb, DP Lam, YW Lin, SH Chan, FYM Hu, YF Weng, X Beling, CD Fung, SHY	1999	78
Improved electrical properties of germanium MOS capacitors with gate dielectric grown in wet-NO ambient Journal:IEEE Electron Device Letters	Xu, JP Lai, PT Li, CX Zou, X Chan, CL	2006	443
Improved electrical properties of HfTiO/GeO x N y gate dielectric Ge MOS capacitors by using wet-NO Ge-surface pretreatment Journal:Applied Physics A: Materials Science and Processing	Xu, JP Zou, X Li, CX Lai, PT Chan, CL	2009	123
Improved properties of Ge MOS capacitors with HfTiON or HfTiO gate dielectric by using wet-NO ge-surface pretreatment Proceeding/Conference:IEEE Conference on Electron Devices and Solid-State Circuits Proceedings	Li, CX Zou, X Xu, JP Lai, PT	2008	113
In vitro establishment of expanded-potential stem cells from mouse pre-implantation embryos or embryonic stem cells Journal:Nature Protocols	Yang, J Ryan, DJ Lan, G Zou, X Liu, P	2019	117
Interface characterisation and internal electric field evaluation of a-Si:H pin solar cell by variable energy positron annhilation spectroscopy Proceeding/Conference:Materials Research Society Symposium Proceedings	Zou, X Chan, YC Webb, DP Lam, YW Chan, FYM Lin, SH Hu, YF Beling, CD Fung, SHY	1999	103
Modeling of scattering at high-k dielectric/SiO2 interface of strained SiGe MOSFETs Proceeding/Conference:ICSICT-2006: 2006 8th International Conference on Solid-State and Integrated Circuit Technology, Proceedings	Zhang, XF Xu, JP Lai, PT Zou, X Li, CX	2007	104
A New Interleaver Design for Iteratively Decoded Bit-Interleaved Coded Modulation Journal:International Journal of Soft Computing	Zou, X Wang, M Feng, G	2008	64
Optimization of Tree-like Core Overlay in Hybrid-structured Application-layer Multicast Journal:KSII Transactions on Internet and Information Systems	Weng, J Zou, X Wang, M	2012	66
Photoinduced Dehydrogenation of Defects in Undoped a-Si:H Using Positron Annihilation Spectroscopy Journal:Physical Review Letters	Zou, X Chan, YC Webb, DP Lam, YW Hu, YF Beling, CD Fung, S Weng, HM	2000	102
Preparation of high-quality gate dielectrics for Ge MOSFET's in wet ambients Proceeding/Conference:Proceedings of the International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2006	Lai, PT Xu, JP Li, CX Zou, X Chen, WB	2007	79

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