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Article: Electronic properties of a rough quantum film

TitleElectronic properties of a rough quantum film
Authors
Hong, KMKwok, PCKChui, PC
KeywordsA. Disordered Systems
A. Thin Films
Issue Date1998
PublisherPergamon. The Journal's web site is located at http://www.elsevier.com/locate/ssc
Citation
Solid State Communications, 1998, v. 107 n. 9, p. 483-486 How to Cite?
AbstractWe use the coherent potential approximation to study the effect of surface roughness on the electronic properties of electrons in a quasi-two-dimensional quantum film. Calculations of the local and average density of states and electrical conductivity are presented. © 1998 Elsevier Science Ltd. All rights reserved.
Persistent Identifierhttp://hdl.handle.net/10722/155075
ISSN
0038-1098
2021 Impact Factor: 1.934
2020 SCImago Journal Rankings: 0.429
References
References in Scopus

 

DC FieldValueLanguage
dc.contributor.authorHong, KMen_US
dc.contributor.authorKwok, PCKen_US
dc.contributor.authorChui, PCen_US
dc.date.accessioned2012-08-08T08:31:45Z-
dc.date.available2012-08-08T08:31:45Z-
dc.date.issued1998en_US
dc.identifier.citationSolid State Communications, 1998, v. 107 n. 9, p. 483-486en_US
dc.identifier.issn0038-1098en_US
dc.identifier.urihttp://hdl.handle.net/10722/155075-
dc.description.abstractWe use the coherent potential approximation to study the effect of surface roughness on the electronic properties of electrons in a quasi-two-dimensional quantum film. Calculations of the local and average density of states and electrical conductivity are presented. © 1998 Elsevier Science Ltd. All rights reserved.en_US
dc.languageengen_US
dc.publisherPergamon. The Journal's web site is located at http://www.elsevier.com/locate/sscen_US
dc.relation.ispartofSolid State Communicationsen_US
dc.subjectA. Disordered Systemsen_US
dc.subjectA. Thin Filmsen_US
dc.titleElectronic properties of a rough quantum filmen_US
dc.typeArticleen_US
dc.identifier.emailChui, PC:pcchui@eee.hku.hken_US
dc.identifier.authorityChui, PC=rp00114en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.scopuseid_2-s2.0-0032117880en_US
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0032117880&selection=ref&src=s&origin=recordpageen_US
dc.identifier.volume107en_US
dc.identifier.issue9en_US
dc.identifier.spage483en_US
dc.identifier.epage486en_US
dc.publisher.placeUnited Kingdomen_US
dc.identifier.scopusauthoridHong, KM=15620999800en_US
dc.identifier.scopusauthoridKwok, PCK=7101871278en_US
dc.identifier.scopusauthoridChui, PC=13309913400en_US
dc.identifier.issnl0038-1098-

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