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Conference Paper: Estimation of internal junction temperature & thermal resistance of light-emitting diodes using external luminous flux measurements

TitleEstimation of internal junction temperature & thermal resistance of light-emitting diodes using external luminous flux measurements
Authors
Tao, XHLi, SNHui, SYR
KeywordsLed System Theory
Light-Emitting Diodes
Lighting
Issue Date2010
Citation
2010 Ieee Energy Conversion Congress And Exposition, Ecce 2010 - Proceedings, 2010, p. 179-183 How to Cite?
DOI: http://dx.doi.org/10.1109/ECCE.2010.5618051
AbstractAlthough critical to the lifetime of LED, the junction temperature of LED cannot be measured easily. From the general photo-electro-thermal theory for LED systems, new equations for estimating the internal junction temperature T j and junction-case thermal resistance Rjc of LED from the luminous flux measurements, which can be obtained relatively easily, are presented and verified practically. These equations provide a valuable tool for checking Tj in LED system design without expensive equipment. © 2010 IEEE.
Persistent Identifierhttp://hdl.handle.net/10722/158662
ISI Accession Number ID
WOS:000562726300026
References
References in Scopus

 

DC FieldValueLanguage
dc.contributor.authorTao, XHen_US
dc.contributor.authorLi, SNen_US
dc.contributor.authorHui, SYRen_US
dc.date.accessioned2012-08-08T09:00:44Z-
dc.date.available2012-08-08T09:00:44Z-
dc.date.issued2010en_US
dc.identifier.citation2010 Ieee Energy Conversion Congress And Exposition, Ecce 2010 - Proceedings, 2010, p. 179-183en_US
dc.identifier.urihttp://hdl.handle.net/10722/158662-
dc.description.abstractAlthough critical to the lifetime of LED, the junction temperature of LED cannot be measured easily. From the general photo-electro-thermal theory for LED systems, new equations for estimating the internal junction temperature T j and junction-case thermal resistance Rjc of LED from the luminous flux measurements, which can be obtained relatively easily, are presented and verified practically. These equations provide a valuable tool for checking Tj in LED system design without expensive equipment. © 2010 IEEE.en_US
dc.languageengen_US
dc.relation.ispartof2010 IEEE Energy Conversion Congress and Exposition, ECCE 2010 - Proceedingsen_US
dc.subjectLed System Theoryen_US
dc.subjectLight-Emitting Diodesen_US
dc.subjectLightingen_US
dc.titleEstimation of internal junction temperature & thermal resistance of light-emitting diodes using external luminous flux measurementsen_US
dc.typeConference_Paperen_US
dc.identifier.emailHui, SYR:ronhui@eee.hku.hken_US
dc.identifier.authorityHui, SYR=rp01510en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1109/ECCE.2010.5618051en_US
dc.identifier.scopuseid_2-s2.0-78650118913en_US
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-78650118913&selection=ref&src=s&origin=recordpageen_US
dc.identifier.spage179en_US
dc.identifier.epage183en_US
dc.identifier.isiWOS:000562726300026-
dc.identifier.scopusauthoridTao, XH=36086850500en_US
dc.identifier.scopusauthoridLi, SN=36086429200en_US
dc.identifier.scopusauthoridHui, SYR=7202831744en_US

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