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Conference Paper: Edge effect on thermally excited mag-noise in magnetic tunnel junction sensors

TitleEdge effect on thermally excited mag-noise in magnetic tunnel junction sensors
Authors
Zeng, TZhou, YLin, KWLai, PTPong, PWT
KeywordsApplied field
Edges
Free layer (FL)
Hard bias field
Magnetic tunnel junction (MTJ)
Spatial distribution
Thermal mag-noise
Issue Date2012
PublisherIEEE. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=20
Citation
The IEEE International Magnetics Conference (INTERMAG 2012), Vancouver, BC., 7-11 May 2012. In IEEE Transactions on Magnetics, 2012, v. 48 n. 11, p. 2831-2834 How to Cite?
DOI: http://dx.doi.org/10.1109/TMAG.2012.2198201
AbstractThermally excited magnetic noise (mag-noise) has gradually become a major concern in magnetic tunnel junction sensors. By conducting micromagnetic simulation, the spatial distribution of thermal mag-noise in the free layer (FL) was obtained under various hard bias (HB) field and applied field. It was demonstrated that the edges are the main contributor of thermal mag-noise in the FL. This result could be explained by the nonuniform distribution of the stiffness field around the edges. It was also found that both HB field and applied field could suppress the thermal mag-noise in edges. A relatively high applied field will decrease the influence of HB field on mag-noise in the edges. © 2012 IEEE.
DescriptionThis journal issue contains selected papers from the 2012 International Magnetics (INTERMAG) Conference
Session AP - Magnetic Tunnel Junctions and Spin Valves (Poster Session): no. AP-14
Persistent Identifierhttp://hdl.handle.net/10722/165288
ISSN
0018-9464
2021 Impact Factor: 1.848
2020 SCImago Journal Rankings: 0.620
ISI Accession Number ID
WOS:000310194400026

 

DC FieldValueLanguage
dc.contributor.authorZeng, Ten_US
dc.contributor.authorZhou, Yen_US
dc.contributor.authorLin, KWen_US
dc.contributor.authorLai, PTen_US
dc.contributor.authorPong, PWTen_US
dc.date.accessioned2012-09-20T08:16:42Z-
dc.date.available2012-09-20T08:16:42Z-
dc.date.issued2012en_US
dc.identifier.citationThe IEEE International Magnetics Conference (INTERMAG 2012), Vancouver, BC., 7-11 May 2012. In IEEE Transactions on Magnetics, 2012, v. 48 n. 11, p. 2831-2834en_US
dc.identifier.issn0018-9464-
dc.identifier.urihttp://hdl.handle.net/10722/165288-
dc.descriptionThis journal issue contains selected papers from the 2012 International Magnetics (INTERMAG) Conference-
dc.descriptionSession AP - Magnetic Tunnel Junctions and Spin Valves (Poster Session): no. AP-14-
dc.description.abstractThermally excited magnetic noise (mag-noise) has gradually become a major concern in magnetic tunnel junction sensors. By conducting micromagnetic simulation, the spatial distribution of thermal mag-noise in the free layer (FL) was obtained under various hard bias (HB) field and applied field. It was demonstrated that the edges are the main contributor of thermal mag-noise in the FL. This result could be explained by the nonuniform distribution of the stiffness field around the edges. It was also found that both HB field and applied field could suppress the thermal mag-noise in edges. A relatively high applied field will decrease the influence of HB field on mag-noise in the edges. © 2012 IEEE.-
dc.languageengen_US
dc.publisherIEEE. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=20-
dc.relation.ispartofIEEE Transactions on Magneticsen_US
dc.subjectApplied field-
dc.subjectEdges-
dc.subjectFree layer (FL)-
dc.subjectHard bias field-
dc.subjectMagnetic tunnel junction (MTJ)-
dc.subjectSpatial distribution-
dc.subjectThermal mag-noise-
dc.titleEdge effect on thermally excited mag-noise in magnetic tunnel junction sensorsen_US
dc.typeConference_Paperen_US
dc.identifier.emailZeng, T: tuizeng@hku.hken_US
dc.identifier.emailZhou, Y: yanzhou@hku.hken_US
dc.identifier.emailLai, PT: laip@eee.hku.hken_US
dc.identifier.emailPong, PWT: ppong@hkucc.hku.hk-
dc.identifier.authorityZhou, Y=rp01541en_US
dc.identifier.authorityLai, PT=rp00130en_US
dc.identifier.authorityPong, PWT=rp00217en_US
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1109/TMAG.2012.2198201-
dc.identifier.scopuseid_2-s2.0-84867769129-
dc.identifier.hkuros202150en_US
dc.identifier.hkuros209744-
dc.identifier.hkuros219687-
dc.identifier.hkuros220233-
dc.identifier.volume48-
dc.identifier.issue11-
dc.identifier.spage2831en_US
dc.identifier.epage2834en_US
dc.identifier.isiWOS:000310194400026-
dc.publisher.placeUnited States-
dc.description.otherThe IEEE International Magnetics Conference (INTERMAG 2012), Vancouver, BC., 7-11 May 2012. In IEEE Transactions on Magnetics, 2012, v. 48 n. 11, p. 2831-2834-
dc.customcontrol.immutablesml 130906-
dc.identifier.issnl0018-9464-

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