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Article: Corrigendum to "Spectroscopic ellipsometry characterization of polymer-fullerene blend films" [Thin Solid Films 517 (2008) 1047-1052] (DOI:10.1016/j.tsf.2008.05.038)

TitleCorrigendum to "Spectroscopic ellipsometry characterization of polymer-fullerene blend films" [Thin Solid Films 517 (2008) 1047-1052] (DOI:10.1016/j.tsf.2008.05.038)
Authors
Ng, AMCCheung, KYFung, MKDjurišić, ABChan, WK
Issue Date2009
PublisherElsevier S.A.. The Journal's web site is located at http://www.elsevier.com/locate/tsf
Citation
Thin Solid Films, 2009, v. 517 n. 15, p. 4491 How to Cite?
DOI: http://dx.doi.org/10.1016/j.tsf.2009.01.028
Persistent Identifierhttp://hdl.handle.net/10722/168375
ISSN
0040-6090
2021 Impact Factor: 2.358
2020 SCImago Journal Rankings: 0.544
ISI Accession Number ID
WOS:000266840100042

 

DC FieldValueLanguage
dc.contributor.authorNg, AMCen_HK
dc.contributor.authorCheung, KYen_HK
dc.contributor.authorFung, MKen_HK
dc.contributor.authorDjurišić, ABen_HK
dc.contributor.authorChan, WKen_HK
dc.date.accessioned2012-10-08T03:18:08Z-
dc.date.available2012-10-08T03:18:08Z-
dc.date.issued2009en_HK
dc.identifier.citationThin Solid Films, 2009, v. 517 n. 15, p. 4491en_HK
dc.identifier.issn0040-6090en_HK
dc.identifier.urihttp://hdl.handle.net/10722/168375-
dc.languageengen_US
dc.publisherElsevier S.A.. The Journal's web site is located at http://www.elsevier.com/locate/tsfen_HK
dc.relation.ispartofThin Solid Filmsen_HK
dc.titleCorrigendum to "Spectroscopic ellipsometry characterization of polymer-fullerene blend films" [Thin Solid Films 517 (2008) 1047-1052] (DOI:10.1016/j.tsf.2008.05.038)en_HK
dc.typeArticleen_HK
dc.identifier.emailDjurišić, AB: dalek@hku.hken_HK
dc.identifier.emailChan, WK: waichan@hku.hken_HK
dc.identifier.authorityDjurišić, AB=rp00690en_HK
dc.identifier.authorityChan, WK=rp00667en_HK
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1016/j.tsf.2009.01.028en_HK
dc.identifier.scopuseid_2-s2.0-65449189124en_HK
dc.identifier.volume517en_HK
dc.identifier.issue15en_HK
dc.identifier.spage4491en_HK
dc.identifier.epage4491en_HK
dc.identifier.isiWOS:000266840100042-
dc.publisher.placeSwitzerlanden_HK
dc.identifier.scopusauthoridNg, AMC=12140078600en_HK
dc.identifier.scopusauthoridCheung, KY=25229974800en_HK
dc.identifier.scopusauthoridFung, MK=35191896100en_HK
dc.identifier.scopusauthoridDjurišić, AB=7004904830en_HK
dc.identifier.scopusauthoridChan, WK=13310083000en_HK
dc.identifier.issnl0040-6090-

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