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Article: Source Reconstruction Method-Based Radiated Emission Characterization for PCBs

TitleSource Reconstruction Method-Based Radiated Emission Characterization for PCBs
Authors
Issue Date2013
Citation
IEEE Transactions on Electron Devices, 2013, v. 55 n. 5, p. 933-940 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/185853
ISSN
2019 Impact Factor: 1.882
2015 SCImago Journal Rankings: 1.329
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorLI, Pen_US
dc.contributor.authorJiang, Len_US
dc.date.accessioned2013-08-20T11:44:01Z-
dc.date.available2013-08-20T11:44:01Z-
dc.date.issued2013-
dc.identifier.citationIEEE Transactions on Electron Devices, 2013, v. 55 n. 5, p. 933-940en_US
dc.identifier.issn0018-9375-
dc.identifier.urihttp://hdl.handle.net/10722/185853-
dc.languageengen_US
dc.relation.ispartofIEEE Transactions on Electron Devicesen_US
dc.titleSource Reconstruction Method-Based Radiated Emission Characterization for PCBsen_US
dc.typeArticleen_US
dc.identifier.emailJiang, L: jianglj@hku.hken_US
dc.identifier.authorityJiang, L=rp01338en_US
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1109/TEMC.2012.2235837-
dc.identifier.scopuseid_2-s2.0-84886384741-
dc.identifier.hkuros218836en_US
dc.identifier.eissn1558-187X-
dc.identifier.isiWOS:000325848700016-

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