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Article: Raman scattering investigations on Co-doped ZnO epitaxial films: Local vibration modes and defect associated ferromagnetism

TitleRaman scattering investigations on Co-doped ZnO epitaxial films: Local vibration modes and defect associated ferromagnetism
Authors
Cao, QHe, SMDeng, YZhu, DPCui, XLiu, GLZhang, HJYan, SSChen, YXMei, LM
KeywordsEpitaxial films
Oxide magnetic semiconductor
Raman scattering
Issue Date2014
PublisherElsevier B.V.. The Journal's web site is located at http://www.elsevier.com/locate/cap
Citation
Current Applied Physics, 2014, v. 14, p. 744-748 How to Cite?
DOI: http://dx.doi.org/10.1016/j.cap.2014.03.011
Persistent Identifierhttp://hdl.handle.net/10722/200802
ISI Accession Number ID
WOS:000335909000020

 

DC FieldValueLanguage
dc.contributor.authorCao, Qen_US
dc.contributor.authorHe, SMen_US
dc.contributor.authorDeng, Yen_US
dc.contributor.authorZhu, DPen_US
dc.contributor.authorCui, Xen_US
dc.contributor.authorLiu, GLen_US
dc.contributor.authorZhang, HJen_US
dc.contributor.authorYan, SSen_US
dc.contributor.authorChen, YXen_US
dc.contributor.authorMei, LMen_US
dc.date.accessioned2014-08-21T07:01:45Z-
dc.date.available2014-08-21T07:01:45Z-
dc.date.issued2014en_US
dc.identifier.citationCurrent Applied Physics, 2014, v. 14, p. 744-748en_US
dc.identifier.urihttp://hdl.handle.net/10722/200802-
dc.languageengen_US
dc.publisherElsevier B.V.. The Journal's web site is located at http://www.elsevier.com/locate/capen_US
dc.relation.ispartofCurrent Applied Physicsen_US
dc.subjectEpitaxial films-
dc.subjectOxide magnetic semiconductor-
dc.subjectRaman scattering-
dc.titleRaman scattering investigations on Co-doped ZnO epitaxial films: Local vibration modes and defect associated ferromagnetismen_US
dc.typeArticleen_US
dc.identifier.emailDeng, Y: dengyy07@hku.hken_US
dc.identifier.emailCui, X: xdcui@hku.hken_US
dc.identifier.authorityCui, X=rp00689en_US
dc.identifier.doi10.1016/j.cap.2014.03.011en_US
dc.identifier.scopuseid_2-s2.0-84898071933-
dc.identifier.hkuros234150en_US
dc.identifier.volume14en_US
dc.identifier.spage744en_US
dc.identifier.epage748en_US
dc.identifier.isiWOS:000335909000020-

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