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Article: Cosimulation of Electromagnetics-Circuit Systems Exploiting DGTD and MNA

TitleCosimulation of Electromagnetics-Circuit Systems Exploiting DGTD and MNA
Authors
Li, PJiang, LBagci, H
KeywordsDiscontinuous Galerkin time domain (DGTD) method
hybrid EM-circuit solver
local time stepping (LTS)
modified nodal analysis (MNA)
multiport circuit networks
Newton-Raphson method
nonlinear elements
transient analysis.
Issue Date2014
Citation
IEEE Transactions on Components, Packaging and Manufacturing Technology, 2014, v. 4, p. 1052-1061 How to Cite?
DOI: http://dx.doi.org/10.1109/TCPMT.2014.2316137
Persistent Identifierhttp://hdl.handle.net/10722/216974
ISSN
2156-3950
2021 Impact Factor: 1.922
2020 SCImago Journal Rankings: 0.496
ISI Accession Number ID
WOS:000337136200012

 

DC FieldValueLanguage
dc.contributor.authorLi, P-
dc.contributor.authorJiang, L-
dc.contributor.authorBagci, H-
dc.date.accessioned2015-09-18T05:44:51Z-
dc.date.available2015-09-18T05:44:51Z-
dc.date.issued2014-
dc.identifier.citationIEEE Transactions on Components, Packaging and Manufacturing Technology, 2014, v. 4, p. 1052-1061-
dc.identifier.issn2156-3950-
dc.identifier.urihttp://hdl.handle.net/10722/216974-
dc.languageeng-
dc.relation.ispartofIEEE Transactions on Components, Packaging and Manufacturing Technology-
dc.subjectDiscontinuous Galerkin time domain (DGTD) method-
dc.subjecthybrid EM-circuit solver-
dc.subjectlocal time stepping (LTS)-
dc.subjectmodified nodal analysis (MNA)-
dc.subjectmultiport circuit networks-
dc.subjectNewton-Raphson method-
dc.subjectnonlinear elements-
dc.subjecttransient analysis.-
dc.titleCosimulation of Electromagnetics-Circuit Systems Exploiting DGTD and MNA-
dc.typeArticle-
dc.identifier.emailJiang, L: jianglj@hku.hk-
dc.identifier.authorityJiang, L=rp01338-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1109/TCPMT.2014.2316137-
dc.identifier.scopuseid_2-s2.0-84902213175-
dc.identifier.hkuros251799-
dc.identifier.volume4-
dc.identifier.spage1052-
dc.identifier.epage1061-
dc.identifier.eissn2156-3985-
dc.identifier.isiWOS:000337136200012-
dc.identifier.issnl2156-3950-

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