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Conference Paper: Systematic Hysteresis Compensator Design based on Extended Unparallel Prandtl-Ishlinskii Model for SPM Imaging Rectification

TitleSystematic Hysteresis Compensator Design based on Extended Unparallel Prandtl-Ishlinskii Model for SPM Imaging Rectification
Authors
Issue Date2017
PublisherElsevier for International Federation of Automatic Control. The Journal's web site is located at http://www.sciencedirect.com/science/journal/24058963?sdc=1
Citation
The 20th World Congress of the International Federation of Automatic Control (IFAC), Toulouse, France, 9-14 July 2017. In IFAC-PapersOnLine, 2017, v. 50 n. 1, p. 10901-10906 How to Cite?
AbstractScanning probe microscopy (SPM) technology plays the irreplaceable role in investigating micro/nano world, which has been bringing tremendous development opportunities to various fields. To enhance maneuverability, SPM can be modified into a nanomanipulation system with its scanning probe as the end-effector. The probe is commonly mounted on smart material based actuators to generate precise motion with nanometer level resolution. However, instinctive hysteretic characteristics ubiquitously exist in smart material actuators, which degrade their arbitrary positioning precision. To effectively represent and further reduce complex hysteretic effects, this paper proposes to utilize the modified Prandtl-Ishlinskii (PI) model: extended unparallel PI (EUPI) model, which possesses advantages such as the flexible modeling capability (compared to the prevalently implemented modified PI models) and the easy-to-use property for construction and identification (compared to the well known Preisach model and the Generalized PI (GPI) model). To effectively reduce complex hysteresis, the EUPI model based compensator (IMUPI compensator) is required to be flexible and precise. To efficiently design such a compensator satisfying stability requirement, this study proposes a systematic approach, including stabilizing gain selection and analytical calculation of boundary gains of the EUPI irreversible component. As a demonstration, satisfactorily precise IMUPI compensator was established according to this systematic design approach and tested through simulations on rectifying Atomic Force Microscopy (AFM, one special SPM) imaging process distorted by complex hysteresis.
Persistent Identifierhttp://hdl.handle.net/10722/252291
ISSN
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorSun, Z-
dc.contributor.authorSong, B-
dc.contributor.authorXi, N-
dc.contributor.authorYang, R-
dc.contributor.authorChen, L-
dc.contributor.authorCheng, Y-
dc.contributor.authorBi, S-
dc.contributor.authorLI, C-
dc.contributor.authorHao, L-
dc.date.accessioned2018-04-16T07:41:55Z-
dc.date.available2018-04-16T07:41:55Z-
dc.date.issued2017-
dc.identifier.citationThe 20th World Congress of the International Federation of Automatic Control (IFAC), Toulouse, France, 9-14 July 2017. In IFAC-PapersOnLine, 2017, v. 50 n. 1, p. 10901-10906-
dc.identifier.issn2405-8963-
dc.identifier.urihttp://hdl.handle.net/10722/252291-
dc.description.abstractScanning probe microscopy (SPM) technology plays the irreplaceable role in investigating micro/nano world, which has been bringing tremendous development opportunities to various fields. To enhance maneuverability, SPM can be modified into a nanomanipulation system with its scanning probe as the end-effector. The probe is commonly mounted on smart material based actuators to generate precise motion with nanometer level resolution. However, instinctive hysteretic characteristics ubiquitously exist in smart material actuators, which degrade their arbitrary positioning precision. To effectively represent and further reduce complex hysteretic effects, this paper proposes to utilize the modified Prandtl-Ishlinskii (PI) model: extended unparallel PI (EUPI) model, which possesses advantages such as the flexible modeling capability (compared to the prevalently implemented modified PI models) and the easy-to-use property for construction and identification (compared to the well known Preisach model and the Generalized PI (GPI) model). To effectively reduce complex hysteresis, the EUPI model based compensator (IMUPI compensator) is required to be flexible and precise. To efficiently design such a compensator satisfying stability requirement, this study proposes a systematic approach, including stabilizing gain selection and analytical calculation of boundary gains of the EUPI irreversible component. As a demonstration, satisfactorily precise IMUPI compensator was established according to this systematic design approach and tested through simulations on rectifying Atomic Force Microscopy (AFM, one special SPM) imaging process distorted by complex hysteresis.-
dc.languageeng-
dc.publisherElsevier for International Federation of Automatic Control. The Journal's web site is located at http://www.sciencedirect.com/science/journal/24058963?sdc=1-
dc.relation.ispartofIFAC-PapersOnLine-
dc.titleSystematic Hysteresis Compensator Design based on Extended Unparallel Prandtl-Ishlinskii Model for SPM Imaging Rectification-
dc.typeConference_Paper-
dc.identifier.emailSun, Z: sunzy@hku.hk-
dc.identifier.emailXi, N: xining@hku.hk-
dc.identifier.authorityXi, N=rp02044-
dc.identifier.doi10.1016/j.ifacol.2017.08.2450-
dc.identifier.hkuros284880-
dc.identifier.volume50-
dc.identifier.issue1-
dc.identifier.spage10901-
dc.identifier.epage10906-
dc.identifier.isiWOS:000423965100307-
dc.publisher.placeUnited States-

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