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Conference Paper: Noise Analysis of Dual-wavelength Digital Holographic Microscopy

TitleNoise Analysis of Dual-wavelength Digital Holographic Microscopy
Authors
Issue Date2019
PublisherOptical Society of America. The proceedings' web site is located at https://www.osapublishing.org/conference.cfm?meetingid=15&yr=2019
Citation
Computational Optical Sensing and Imaging (COSI) 2019, Munich, Germany, 24–27 June 2019. In Proceedings Imaging and Applied Optics 2019 (COSI, IS, MATH, pcAOP), paper CTu4C.5 How to Cite?
AbstractDual-wavelength digital holographic microscopy (DHM) can provide sub-nanometer resolution for sample profile characterization. We analyze the noise requirement for extension of the vertical measuring range and the noise suppression methods in DHM.
DescriptionSession CTu4C • Advances in Microscopy / Digital Holographic Microscopy - CTu4C.5 ; OSA Technical Digest (Optical Society of America, 2019) - paper CTu4C.5
Persistent Identifierhttp://hdl.handle.net/10722/277799
ISBN

 

DC FieldValueLanguage
dc.contributor.authorZhang, X-
dc.contributor.authorYang, Y-
dc.contributor.authorLam, EYM-
dc.contributor.authorXu, Z-
dc.date.accessioned2019-10-04T08:01:35Z-
dc.date.available2019-10-04T08:01:35Z-
dc.date.issued2019-
dc.identifier.citationComputational Optical Sensing and Imaging (COSI) 2019, Munich, Germany, 24–27 June 2019. In Proceedings Imaging and Applied Optics 2019 (COSI, IS, MATH, pcAOP), paper CTu4C.5-
dc.identifier.isbn9781943580637-
dc.identifier.urihttp://hdl.handle.net/10722/277799-
dc.descriptionSession CTu4C • Advances in Microscopy / Digital Holographic Microscopy - CTu4C.5 ; OSA Technical Digest (Optical Society of America, 2019) - paper CTu4C.5-
dc.description.abstractDual-wavelength digital holographic microscopy (DHM) can provide sub-nanometer resolution for sample profile characterization. We analyze the noise requirement for extension of the vertical measuring range and the noise suppression methods in DHM.-
dc.languageeng-
dc.publisherOptical Society of America. The proceedings' web site is located at https://www.osapublishing.org/conference.cfm?meetingid=15&yr=2019-
dc.relation.ispartofImaging and Applied Optics Congress 2019 (COSI, IS, MATH, pcAOP)-
dc.rightsImaging and Applied Optics 2019 (COSI, IS, MATH, pcAOP). Copyright © Optical Society of America.-
dc.titleNoise Analysis of Dual-wavelength Digital Holographic Microscopy-
dc.typeConference_Paper-
dc.identifier.emailLam, EYM: elam@eee.hku.hk-
dc.identifier.authorityLam, EYM=rp00131-
dc.identifier.doi10.1364/COSI.2019.CTu4C.5-
dc.identifier.hkuros306267-
dc.identifier.spagepaper CTu4C.5-
dc.identifier.epagepaper CTu4C.5-
dc.publisher.placeWashington, D.C.-

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