File Download

There are no files associated with this item.

  Links for fulltext
     (May Require Subscription)
Supplementary

Conference Paper: Modeling and Analysis of Micro-bubble Stiffness Measured by Atomic Force Microscopy

TitleModeling and Analysis of Micro-bubble Stiffness Measured by Atomic Force Microscopy
Authors
Issue Date2019
PublisherIEEE. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1001116
Citation
2019 IEEE 14th International Conference on Nano/Micro Engineered and Molecular Systems (NEMS), Bangkok, Thailand, 11-14 April 2019, p. 209-212 How to Cite?
AbstractIn the past 50-60 years, the bubble has gained attention for its wide range of applications, especially in micro-scale. Research on the bubble's mechanical properties is necessary so that we can manipulate the bubble better (for better implementation). Precise measurement of the microbubble's mechanical properties (e.g., stiffness and surface tension) relies largely on delicate manipulation technology, as a result, atomic force microscopy (AFM) has been widely implemented. However, in previous AFM-scanned figures, microbubbles were usually captured with a relatively large distortion and the bubble topology was not clear enough to locate precisely the AFM probe so that further nanomanipulation or measurements could not occur. In this paper, AFM-based properties measurement of a single micro-bubble has been studied. An electrochemistry method was applied to generate stable bubbles. By using force volume mode, a single bubble was captured. The bubble, which should be isotropic, showed instead location-dependent anisotropic characteristics. In this case, the shape of the bubble (which influences the angle between the bubble's surface and the AFM tip) was proposed as the key reason to explain the anisotropic phenomenon, and a corresponding model was established to verify the hypothesis.
Persistent Identifierhttp://hdl.handle.net/10722/283057
ISBN

 

DC FieldValueLanguage
dc.contributor.authorYu, H-
dc.contributor.authorSun, Z-
dc.contributor.authorXue, Y-
dc.contributor.authorXi, N-
dc.date.accessioned2020-06-05T06:24:27Z-
dc.date.available2020-06-05T06:24:27Z-
dc.date.issued2019-
dc.identifier.citation2019 IEEE 14th International Conference on Nano/Micro Engineered and Molecular Systems (NEMS), Bangkok, Thailand, 11-14 April 2019, p. 209-212-
dc.identifier.isbn978-1-7281-1630-3-
dc.identifier.urihttp://hdl.handle.net/10722/283057-
dc.description.abstractIn the past 50-60 years, the bubble has gained attention for its wide range of applications, especially in micro-scale. Research on the bubble's mechanical properties is necessary so that we can manipulate the bubble better (for better implementation). Precise measurement of the microbubble's mechanical properties (e.g., stiffness and surface tension) relies largely on delicate manipulation technology, as a result, atomic force microscopy (AFM) has been widely implemented. However, in previous AFM-scanned figures, microbubbles were usually captured with a relatively large distortion and the bubble topology was not clear enough to locate precisely the AFM probe so that further nanomanipulation or measurements could not occur. In this paper, AFM-based properties measurement of a single micro-bubble has been studied. An electrochemistry method was applied to generate stable bubbles. By using force volume mode, a single bubble was captured. The bubble, which should be isotropic, showed instead location-dependent anisotropic characteristics. In this case, the shape of the bubble (which influences the angle between the bubble's surface and the AFM tip) was proposed as the key reason to explain the anisotropic phenomenon, and a corresponding model was established to verify the hypothesis.-
dc.languageeng-
dc.publisherIEEE. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1001116-
dc.relation.ispartofIEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS) Proceedings-
dc.rightsIEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS) Proceedings. Copyright © IEEE.-
dc.rights©2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.-
dc.titleModeling and Analysis of Micro-bubble Stiffness Measured by Atomic Force Microscopy-
dc.typeConference_Paper-
dc.identifier.emailXi, N: xining@hku.hk-
dc.identifier.authorityXi, N=rp02044-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1109/NEMS.2019.8915642-
dc.identifier.hkuros310093-
dc.identifier.spage209-
dc.identifier.epage212-
dc.publisher.placeUnited States-

Export via OAI-PMH Interface in XML Formats


OR


Export to Other Non-XML Formats