Domain freezing in potassium dihydrogen phosphate, triglycine sulfate, and CuAlZnNi

Abstract

The temperature dependence of the dielectric constant and dissipation in potassium dihydrogen phosphate (KDP), its deuterated compound (DKDP), triglycine sulfate (TGS), and TGS doped with α-alanine (LATGS) has been studied at various frequencies. It is found that the relaxation time of domain freezing in KDP and DKDP in the kHz range can be described by the Vogel-Fulcher relation. Evidence of domain freezing in TGS is presented through an analysis of relaxation time related to domain walls and a comparison between TGS and LATGS. Studies of internal friction and compliance show preliminary evidence of domain freezing in CuAlZnNi alloy. A domain-freezing model is proposed based upon the collective pinning of randomly distributed pinning centers to domain walls. Some key experiments related to domain freezing, such as (1) the Vogel-Fulcher relation for relaxation time; (2) the size effect of domain freezing; (3) two kinds of relaxation in low- and high-frequency ranges, respectively; and (4) the dependence of TF on defect density and applied field, etc., are explained.