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Conference Paper: Piping classification to metamorphic testing: an empirical study towards better effectiveness for the identification of failures in mesh simplification programs
Title | Piping classification to metamorphic testing: an empirical study towards better effectiveness for the identification of failures in mesh simplification programs |
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Authors | |
Keywords | Classification Mesh simplification Metamorphic testing Test oracle problem |
Issue Date | 2007 |
Publisher | Institute of Electrical and Electronics Engineers. The Journal's web site is located at http://www.ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000143 |
Citation | The 31st Annual International Computer Software and Applications Conference (COMPSAC 2007), Beijing, China, 24-27 July 2007. In Conference Proceedings, 2007, p. 397-404 How to Cite? |
Abstract | Mesh simplification is a mainstream technique to render graphics responsively in modern graphical software. However, the graphical nature of the output poses a test oracle problem in testing. Previous work uses pattern classification to identify failures. Although such an approach may be promising, it may conservatively mark the test result of a failure-causing test case as passed. This paper proposes a methodology that pipes the test cases marked as passed by the pattern classification component to a metamorphic testing component to look for missed failures. The empirical study uses three simple and general metamorphic relations as subjects, and the experimental results show a 10 percent improvement of effectiveness in the identification of failures. © 2007 IEEE. |
Sponsorship | This research is supported in part by a grant of the Research Grants Council of Hong Kong (project no. 714504), a grant of City University of Hong Kong (project no. 200079), and a grant of The University of Hong Kong. |
Persistent Identifier | http://hdl.handle.net/10722/55042 |
ISBN | |
ISSN | 2020 SCImago Journal Rankings: 0.216 |
References |
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chan, WK | - |
dc.contributor.author | Ho, JCF | - |
dc.contributor.author | Tse, TH | - |
dc.date.accessioned | 2009-07-15T02:57:56Z | - |
dc.date.available | 2009-07-15T02:57:56Z | - |
dc.date.issued | 2007 | - |
dc.identifier.citation | The 31st Annual International Computer Software and Applications Conference (COMPSAC 2007), Beijing, China, 24-27 July 2007. In Conference Proceedings, 2007, p. 397-404 | - |
dc.identifier.isbn | 978-076952870-0 | - |
dc.identifier.issn | 0730-3157 | - |
dc.identifier.uri | http://hdl.handle.net/10722/55042 | - |
dc.description.abstract | Mesh simplification is a mainstream technique to render graphics responsively in modern graphical software. However, the graphical nature of the output poses a test oracle problem in testing. Previous work uses pattern classification to identify failures. Although such an approach may be promising, it may conservatively mark the test result of a failure-causing test case as passed. This paper proposes a methodology that pipes the test cases marked as passed by the pattern classification component to a metamorphic testing component to look for missed failures. The empirical study uses three simple and general metamorphic relations as subjects, and the experimental results show a 10 percent improvement of effectiveness in the identification of failures. © 2007 IEEE. | - |
dc.description.sponsorship | This research is supported in part by a grant of the Research Grants Council of Hong Kong (project no. 714504), a grant of City University of Hong Kong (project no. 200079), and a grant of The University of Hong Kong. | en |
dc.language | eng | - |
dc.publisher | Institute of Electrical and Electronics Engineers. The Journal's web site is located at http://www.ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000143 | - |
dc.relation.ispartof | IEEE International Computer Software and Applications Conference Proceedings | - |
dc.rights | IEEE International Computer Software and Applications Conference. Proceedings. Copyright © Institute of Electrical and Electronics Engineers. | - |
dc.rights | ©2007 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | - |
dc.subject | Classification | - |
dc.subject | Mesh simplification | - |
dc.subject | Metamorphic testing | - |
dc.subject | Test oracle problem | - |
dc.title | Piping classification to metamorphic testing: an empirical study towards better effectiveness for the identification of failures in mesh simplification programs | - |
dc.type | Conference_Paper | - |
dc.identifier.email | Chan, WK: wkchan@cs.hku.hk | - |
dc.identifier.email | Tse, TH: thtse@cs.hku.hk | - |
dc.identifier.authority | Tse, TH=rp00546 | - |
dc.description.nature | link_to_subscribed_fulltext | en_HK |
dc.identifier.doi | 10.1109/COMPSAC.2007.167 | - |
dc.identifier.scopus | eid_2-s2.0-37349063010 | en_HK |
dc.identifier.hkuros | 126445 | - |
dc.identifier.hkuros | 143844 | - |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-37349063010&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.spage | 397 | - |
dc.identifier.epage | 404 | - |
dc.publisher.place | United States | - |
dc.identifier.scopusauthorid | Chan, WK=23967779900 | en_HK |
dc.identifier.scopusauthorid | Ho, JCF=16241374000 | en_HK |
dc.identifier.scopusauthorid | Tse, TH=7005496974 | en_HK |
dc.customcontrol.immutable | sml 161007 - amended | - |
dc.identifier.issnl | 0730-3157 | - |