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Article: TEM study of the deformation structures around nano-scratches

TitleTEM study of the deformation structures around nano-scratches
Authors
Wo, PCJones, IPNgan, AHW
KeywordsDislocations
Focused ion-beam milling
Nano-scratch
Nanoidentation
TEM
Issue Date2008
PublisherTaylor & Francis Ltd. The Journal's web site is located at http://www.tandf.co.uk/journals/titles/14786435.asp
Citation
Philosophical Magazine, 2008, v. 88 n. 9, p. 1369-1388 How to Cite?
DOI: http://dx.doi.org/10.1080/14786430802148999
AbstractAn in-plane transmission electron microscopy (TEM) investigation carried out on nano-scratches made in a Ni3Al foil revealed a high dislocation density within the scratch core, resulting in severe crystal rotations. The amount and sense of rotation were found to be asymmetrical about the longitudinal centre line of the scratch. Cross-sectional TEM analysis revealed that almost all the dislocations were confined within a semicircular zone having a radius similar to the calculated tip-sample contact size during scratching, in agreement with the in-plane TEM observations.
Persistent Identifierhttp://hdl.handle.net/10722/59113
ISSN
1478-6435
2021 Impact Factor: 1.948
2020 SCImago Journal Rankings: 0.577
ISI Accession Number ID
WOS:000257271400007
References
References in Scopus

 

DC FieldValueLanguage
dc.contributor.authorWo, PCen_HK
dc.contributor.authorJones, IPen_HK
dc.contributor.authorNgan, AHWen_HK
dc.date.accessioned2010-05-31T03:43:06Z-
dc.date.available2010-05-31T03:43:06Z-
dc.date.issued2008en_HK
dc.identifier.citationPhilosophical Magazine, 2008, v. 88 n. 9, p. 1369-1388en_HK
dc.identifier.issn1478-6435en_HK
dc.identifier.urihttp://hdl.handle.net/10722/59113-
dc.description.abstractAn in-plane transmission electron microscopy (TEM) investigation carried out on nano-scratches made in a Ni3Al foil revealed a high dislocation density within the scratch core, resulting in severe crystal rotations. The amount and sense of rotation were found to be asymmetrical about the longitudinal centre line of the scratch. Cross-sectional TEM analysis revealed that almost all the dislocations were confined within a semicircular zone having a radius similar to the calculated tip-sample contact size during scratching, in agreement with the in-plane TEM observations.en_HK
dc.languageengen_HK
dc.publisherTaylor & Francis Ltd. The Journal's web site is located at http://www.tandf.co.uk/journals/titles/14786435.aspen_HK
dc.relation.ispartofPhilosophical Magazineen_HK
dc.subjectDislocationsen_HK
dc.subjectFocused ion-beam millingen_HK
dc.subjectNano-scratchen_HK
dc.subjectNanoidentationen_HK
dc.subjectTEMen_HK
dc.titleTEM study of the deformation structures around nano-scratchesen_HK
dc.typeArticleen_HK
dc.identifier.emailNgan, AHW:hwngan@hkucc.hku.hken_HK
dc.identifier.authorityNgan, AHW=rp00225en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1080/14786430802148999en_HK
dc.identifier.scopuseid_2-s2.0-46649119944en_HK
dc.identifier.hkuros154692en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-46649119944&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume88en_HK
dc.identifier.issue9en_HK
dc.identifier.spage1369en_HK
dc.identifier.epage1388en_HK
dc.identifier.isiWOS:000257271400007-
dc.publisher.placeUnited Kingdomen_HK
dc.identifier.scopusauthoridWo, PC=9433530200en_HK
dc.identifier.scopusauthoridJones, IP=34770157200en_HK
dc.identifier.scopusauthoridNgan, AHW=7006827202en_HK
dc.identifier.citeulike3140608-
dc.identifier.issnl1478-6435-

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