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Article: Microstructural characterization of YBa2Cu3O7-x thin films grown on Y-ZrO2

TitleMicrostructural characterization of YBa2Cu3O7-x thin films grown on Y-ZrO2
Authors
Liu, CXChen, XMWang, YXu, MLuo, GMMai, ZHTang, WGao, JJia, QJZheng, WLChen, ZJ
KeywordsAFM
Microstructure
SEM
YBCO thin films
Issue Date2003
PublisherElsevier SA. The Journal's web site is located at http://www.elsevier.com/locate/tsf
Citation
Thin Solid Films, 2003, v. 437, p. 272-275 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/80862
ISSN
0040-6090
2021 Impact Factor: 2.358
2020 SCImago Journal Rankings: 0.544

 

DC FieldValueLanguage
dc.contributor.authorLiu, CXen_HK
dc.contributor.authorChen, XMen_HK
dc.contributor.authorWang, Yen_HK
dc.contributor.authorXu, Men_HK
dc.contributor.authorLuo, GMen_HK
dc.contributor.authorMai, ZHen_HK
dc.contributor.authorTang, Wen_HK
dc.contributor.authorGao, Jen_HK
dc.contributor.authorJia, QJen_HK
dc.contributor.authorZheng, WLen_HK
dc.contributor.authorChen, ZJen_HK
dc.date.accessioned2010-09-06T08:11:05Z-
dc.date.available2010-09-06T08:11:05Z-
dc.date.issued2003en_HK
dc.identifier.citationThin Solid Films, 2003, v. 437, p. 272-275en_HK
dc.identifier.issn0040-6090en_HK
dc.identifier.urihttp://hdl.handle.net/10722/80862-
dc.languageengen_HK
dc.publisherElsevier SA. The Journal's web site is located at http://www.elsevier.com/locate/tsfen_HK
dc.relation.ispartofThin Solid Filmsen_HK
dc.subjectAFM-
dc.subjectMicrostructure-
dc.subjectSEM-
dc.subjectYBCO thin films-
dc.titleMicrostructural characterization of YBa2Cu3O7-x thin films grown on Y-ZrO2en_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0040-6090&volume=437&spage=272&epage=275&date=2003&atitle=Microstructural+characterization+of+YBa2Cu3O7-x+thin+films+grown+on+Y-ZrO2en_HK
dc.identifier.emailTang, W: whtang@aphy.iphy.ac.cnen_HK
dc.identifier.emailGao, J: jugao@hku.hken_HK
dc.identifier.authorityGao, J=rp00699en_HK
dc.identifier.scopuseid_2-s2.0-0038785561-
dc.identifier.hkuros84990en_HK
dc.identifier.issnl0040-6090-

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