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Conference Paper: The abnormal electroresistance behavior observed in epitaxial La0.8Ca0.2MnO3 thin films

TitleThe abnormal electroresistance behavior observed in epitaxial La0.8Ca0.2MnO3 thin films
Authors
Gao, JHu, F
KeywordsAbnormal electroresistance
Epitaxial thin films
Mixed-valent manganites
Issue Date2006
PublisherElsevier SA. The Journal's web site is located at http://www.elsevier.com/locate/tsf
Citation
8th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures and the 13th International Congress on Thin Films. In Thin Solid Films, 2006, v. 515 n. 2, p. 555-558 How to Cite?
DOI: http://dx.doi.org/10.1016/j.tsf.2005.12.294
Persistent Identifierhttp://hdl.handle.net/10722/80870
ISSN
0040-6090
2021 Impact Factor: 2.358
2020 SCImago Journal Rankings: 0.544
ISI Accession Number ID
WOS:000241220600041

 

DC FieldValueLanguage
dc.contributor.authorGao, Jen_HK
dc.contributor.authorHu, Fen_HK
dc.date.accessioned2010-09-06T08:11:11Z-
dc.date.available2010-09-06T08:11:11Z-
dc.date.issued2006en_HK
dc.identifier.citation8th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures and the 13th International Congress on Thin Films. In Thin Solid Films, 2006, v. 515 n. 2, p. 555-558en_HK
dc.identifier.issn0040-6090en_HK
dc.identifier.urihttp://hdl.handle.net/10722/80870-
dc.languageengen_HK
dc.publisherElsevier SA. The Journal's web site is located at http://www.elsevier.com/locate/tsfen_HK
dc.relation.ispartofThin Solid Filmsen_HK
dc.subjectAbnormal electroresistance-
dc.subjectEpitaxial thin films-
dc.subjectMixed-valent manganites-
dc.titleThe abnormal electroresistance behavior observed in epitaxial La0.8Ca0.2MnO3 thin filmsen_HK
dc.typeConference_Paperen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0040-6090&volume=515&spage=555&epage=558&date=2006&atitle=The+abnormal+electroresistance+behavior+observed+in+epitaxial+La0.8Ca0.2MnO3+thin+filmsen_HK
dc.identifier.emailGao, J: jugao@hku.hken_HK
dc.identifier.emailHu, F: fxhu2002@hku.hken_HK
dc.identifier.authorityGao, J=rp00699en_HK
dc.identifier.doi10.1016/j.tsf.2005.12.294-
dc.identifier.scopuseid_2-s2.0-33748753055-
dc.identifier.hkuros130952en_HK
dc.identifier.isiWOS:000241220600041-
dc.identifier.issnl0040-6090-

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