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Conference Paper: Designing the optimal diagnosability for key quality characteristics using a matrix model

TitleDesigning the optimal diagnosability for key quality characteristics using a matrix model
Authors
Liu, JPChen, YLLuo, ZBChu, LK
Issue Date2003
Citation
IEEE International Conference on the Business of Electronic Product Reliability and Liability, 2003 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/99899

 

DC FieldValueLanguage
dc.contributor.authorLiu, JPen_HK
dc.contributor.authorChen, YLen_HK
dc.contributor.authorLuo, ZBen_HK
dc.contributor.authorChu, LKen_HK
dc.date.accessioned2010-09-25T18:48:46Z-
dc.date.available2010-09-25T18:48:46Z-
dc.date.issued2003en_HK
dc.identifier.citationIEEE International Conference on the Business of Electronic Product Reliability and Liability, 2003-
dc.identifier.urihttp://hdl.handle.net/10722/99899-
dc.languageengen_HK
dc.relation.ispartofIEEE International Conference on the Business of Electronic Product Reliability and Liabilityen_HK
dc.titleDesigning the optimal diagnosability for key quality characteristics using a matrix modelen_HK
dc.typeConference_Paperen_HK
dc.identifier.emailChu, LK: lkchu@hkucc.hku.hken_HK
dc.identifier.authorityChu, LK=rp00113en_HK
dc.identifier.hkuros81444en_HK

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