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	Title	Author(s)	Issue Date	Views
	Electrical properties of ZnO nanorods studied by conductive atomic force microscopy Journal:Journal of Applied Physics	Beinik, I Kratzer, M Wachauer, A Wang, L Lechner, RT Teichert, C Motz, C Anwand, W Brauer, G Chen, XY Hsu, XY Djurišić, AB	2011	189
	Erratum: Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005)) Journal:Journal of Applied Physics	Beinik, I Kratzer, M Wachauer, A Wang, L Lechner, RT Teichert, C Motz, C Anwand, W Brauer, G Chen, XY Hsu, YF Djurišić, AB	2012	35
	Photoresponse from single upright-standing ZnO nanorods explored by photoconductive AFM Journal:Beilstein Journal of Nanotechnology	Beinik, I Kratzer, M Wachauer, A Wang, L Piryatinski, YP Brauer, G Chen, X Hsu, YF Djurisic, A Teichert, C	2013	53
	Scanning probe microscopy-based characterization of ZnO nanorods Proceeding/Conference:INEC 2010 - 2010 3rd International Nanoelectronics Conference, Proceedings	Teichert, C Hou, Y Beinik, I Chen, X Hsu, YF Djurišić, AB Anwand, W Brauer, G	2010	70

Showing results 2 to 5 of 5 < previous