Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2008
194
 
2005
169
 
2002
181
 
1993
62
 
2009
182
 
1995
147
 
Characterization of optical and structural properties of Pt-Si interface by spectroscopic ellipsometry
Proceeding/Conference:Proceedings of the 22nd International Conference on the Physics of Semiconductors, Canada
1994
99
 
1994
190
 
2010
114
 
2007
147
 
2008
85
 
2006
194
 
2004
186
 
2006
174
 
2009
219
 
2009
190
 
2011
132
 
2012
55
 
2004
205
 
1993
163