Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2008
178
 
2005
156
 
2002
172
 
1993
51
 
2009
169
 
1995
136
 
Characterization of optical and structural properties of Pt-Si interface by spectroscopic ellipsometry
Proceeding/Conference:Proceedings of the 22nd International Conference on the Physics of Semiconductors, Canada
1994
87
 
1994
178
 
2010
105
 
2007
136
 
2008
78
 
2006
178
 
2004
175
 
2006
165
 
2009
199
 
2009
178
 
2011
125
 
2012
46
 
2004
183
 
1993
154