Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2002
179
 
1993
62
 
2009
182
 
1995
146
 
Characterization of optical and structural properties of Pt-Si interface by spectroscopic ellipsometry
Proceeding/Conference:Proceedings of the 22nd International Conference on the Physics of Semiconductors, Canada
1994
99
 
1994
189
 
2010
114
 
2007
147
 
2008
84
 
2006
194
 
2004
185
 
2006
172
 
2009
218
 
2009
190
 
2011
131
 
2012
53
 
2004
204
 
1993
161
 
2006
198
 
2003
180