Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2002
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1993
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2009
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1995
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Characterization of optical and structural properties of Pt-Si interface by spectroscopic ellipsometry
Proceeding/Conference:Proceedings of the 22nd International Conference on the Physics of Semiconductors, Canada
1994
105
 
1994
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2010
118
 
2007
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2008
87
 
2006
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2004
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2006
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2009
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2009
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2011
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2012
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2004
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1993
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2006
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2003
181