Browsing by Author Huang, MQ

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Showing results 14 to 22 of 22 < previous 
TitleAuthor(s)Issue DateViews
 
A new multi-function thin-film microsensor based on Ba1-xLaxTiO3
Journal:Smart Materials and Structures
Li, BLai, PTLi, GQZeng, SHHuang, MQ
2000
177
 
New thin-film humidity and thermal micro-sensor with Al/SrNbxTi1-xO3/SiO2/Si structure
Journal:Sensors and Actuators, A: Physical
Li, GQLai, PTZeng, SHHuang, MQLi, B
1999
138
 
On recovery of hot-carrier-induced mobility degradationin off-state thermally-nitrided-oxide N-MOSFET's
Proceeding/Conference:Proceedings of the 3rd International Conference on Solid State and Integrated Circuit Technology
Ma, ZJLai, PTHuang, MQCheng, YCLiu, BY
1992
39
 
Photo-, thermal and humidity sensitivity characteristics of sr1-xLaxTiO3 film on SiO2/Si substrate
Journal:Sensors and Actuators, A: Physical
Li, GQLai, PTZeng, SHHuang, MQCheng, YC
1997
122
 
Photoelectrical properties of Ba1-xLaxTiO3 thin-film resistor
Journal:Sensors and Actuators, A: Physical
Li, BLai, PTLi, GQZeng, SHHuang, MQ
2000
198
 
Sensing properties of Ba1-xLaxNbyTi1-yO3 (x=0.25%, y=0.25%) thin-film on SiO2/Si substrate
Journal:Materials Research Society Symposium - Proceedings
Li, BLai, PTLi, GQZeng, SHHuang, MQ
2001
106
 
A study of various oxide/silicon interfaces by Ar + backsurface bombardment
Journal:Journal of Applied Physics
Lai, PTLi, GQHuang, MQZeng, SHCheng, YC
1999
183
 
Suppression of hot-electron-induced interface degradation in metal-oxide-semiconductor devices by backsurface argon bombardment
Journal:Microelectronics Reliability
Huang, MQLai, PTXu, JPZeng, SHLi, GQCheng, YC
1998
122
 
Suppression of hot-electron-induced interface degradation in metal-oxide-semiconductor devices by backsurface argon bombardment
Proceeding/Conference:Proceedings of the IEEE Hong Kong Electron Devices Meeting
Huang, MQLai, PTXu, JPZeng, SHLi, GQCheng, YC
1997
Showing results 14 to 22 of 22 < previous