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Showing results 7 to 26 of 27 < previous next >

Title	Author(s)	Issue Date	Views
Electrical characteristics of Al-doped ZnO-channel thin-film transistor with high-κ HfON/SiO 2 stack gate dielectric Proceeding/Conference:2010 IEEE International Conference of Electron Devices and Solid-State Circuits, EDSSC 2010	Zou, X Xu, JP Lai, PT Li, Y Ji, F Deng, LF	2010	120
Electrical properties of HfTiO gate-dielectric metal oxide semiconductor capacitors with NO and N 2O surface nitridations Proceeding/Conference:2010 IEEE International Conference of Electron Devices and Solid-State Circuits, EDSSC 2010	Ji, F Xu, JP Li, CX Lai, PT Deng, LF Zou, X	2010	121
Electrical properties of HfTiON gate-dielectric metal-oxide-semiconductor capacitors with different Si-surface nitridations Journal:Applied Physics Letters	Ji, F Xu, JP Lai, PT Li, CX Guan, JG	2007	185
A fringing-capacitance model for deep-submicron MOSFET with high-k gate dielectric Journal:Microelectronics Reliability	Ji, F Xu, JP Lai, PT Guan, JG	2008	166
Higher Hepatocellular Carcinoma (HCC) Incidence In Chronic Hepatitis C (CHC) Patients After Hepatitis C Virus (HCV) Cure Compared To Treated Chronic Hepatitis B (CHB): Results From A Multinational Real-World Cohort Of Patients With Cirrhosis Proceeding/Conference:Hepatology	Park, J Tran, S Ogawa, E Huang, CF Toyoda, H Chen, CH Yeh, ML Tseng, CH Hsu, YC Kawashima, K Preda, C Istratescu, D Yasuda, S Nozaki, A Chuma, M Oh, H Shim, JJ Jeong, SW An, J Ahn, SB Kim, SE Yoon, E Lee, HA Kim, HS Cho, YK Uojima, H Trinh, H Atsukawa, M Itokawa, N Okubo, T Abe, H Lee, DH Jun, MJ Landis, C Liu, J Enomoto, M Watanabe, T Ji, F Wang, W Yu, L Xie, Q Fukunishi, S Asai, A Yokohama, K Ishikawa, T Liu, L Li, J Takahashi, H Inoue, K Eguchi, Y Ishigami, M Ito, T Huang, D Wong, GL Wong, V Lu, C Zang, W Li, J Ueno, Y Haga, H Marciano, S Jing, L Ye, Q Lam, C Ho, DK Do, ST Huang, R Takaguchi, K Senoh, T Chien, N Maeda, M Kudaravalli, S Henry, L Chuang, WL Dai, CY Huang, JF Gadano, AC Yuen, MF Lim, SG Cheung, R Tanaka, Y Jun, DW Yu, ML Nguyen, MH	31-Oct-2022
Impacts of Ti content and annealing temperature on electrical properties of Si MOS capacitors with HfTiON gate dielectric Proceeding/Conference:2009 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2009	Ji, F Xu, JP Li, CX Lai, PT Chan, CL	2009	196
Improved Charge-Trapping Properties of TiON/HfON Dual Charge Storage Layer by Tapered Band Structure Journal:Applied Physics Letters	Liu, L Xu, J Chen, JX Ji, F Lai, PT	2012	43
Improved electrical properties of metal-oxide-semiconductor capacitor with HfTiON gate dielectric by using HfSiON interlayer Journal:Applied Physics Letters	Xu, JP Ji, F Li, CX Lai, PT Guan, JG Liu, YR	2007	110
Improved interface properties of Ge metal-oxide-semiconductor capacitor with TaTiO gate dielectric by using in situ TaON passivation interlayer Journal:Applied Physics Letters	Ji, F Xu, JP Liu, JG Li, CX Lai, PT	2011	192
Improved interfacial properties of Ge MOS capacitor with high-k dielectric by using TaON/GeON dual interlayer Journal:IEEE Electron Device Letters	Ji, F Xu, JP Lai, PT Li, CX Liu, JG	2011	181
Improved Memory Characteristics by NH3-Nitrided GdO as Charge Storage Layer for Nonvolatile Memory Applications Journal:Applied Physics Letters	Liu, L Xu, J Ji, F Chen, JX Lai, PT	2012	63
Improved Memory Window of MONOS Memory Capacitor with GdON as Charge Storage Layer Proceeding/Conference:I E E E Conference on Electron Devices and Solid-State Circuits Proceedings	Liu, L Xu, J Chen, JX Ji, F HUANG, X Lai, PT	2012	40
Influence of gate-electrode fringing capacitance on threshold voltage of nano-MOSFET Proceeding/Conference:ICSICT-2006: 2006 8th International Conference on Solid-State and Integrated Circuit Technology, Proceedings	Ji, F Xu, JP Lai, PT Li, CX	2007	226
Influence of natridation annealing of HfTiO on electrical properties of MOS device Journal:Guti Dianzixue Yanjiu Yu Jinzhan/Research and Progress of Solid State Electronics	Ji, F Xu, J Zhang, H Lai, P Li, C Guan, J	2008	113
Influence of sidewall spacer on threshold voltage of MOSFET with high-k gate dielectric Journal:Microelectronics Reliability	Xu, JP Ji, F Lai, PT Guan, JG	2008	211
A novel MONOS memory with high-κ HfLaON as charge-storage layer Journal:IEEE Transactions on Device and Materials Reliability	Liu, L Xu, JP Ji, F Huang, XD Lai, PT	2011	155
Resolving the genetic heterogeneity of prelingual hearing loss within one family: Performance comparison and application of two targeted next generation sequencing approaches. Journal:Journal of Human Genetics	Yu, L Zhou, X Jin, Z Cheng, J Shen, W Ji, F Liui, L Zhang, X Zhang, MQ Cao, Y Han, D Choy, KW Yuan, H	2014	53
A threshold voltage model for high-k gate-dielectric MOSFETs considering fringing-field effect Journal:Chinese Physics	Ji, F Xu, JP Lai, PT	2007	97
Title: Real-world effectiveness and safety of interferon-free DAAS for 14,676 hepatitis C (CHC) patients with genotypes 1, 2, 3, 4 and 6: a multinational study Proceeding/Conference:Poster presentation at the AASLD The Liver Meeting, November 12-15. 2021. Hepatology	Ji, F Ogawa, E Huang, C-F Toyoda, H Wong, YY Iio, E Jun, DW Liu, L Uojima, H Nozaki, A Chuma, M Tseng, C-H Hsu, .Y-C Atsukawa, M Haga, H Enomoto, M Tamori, A Trinh, HN Landis, C Lee, DH Watanabe, T Takahashi, H Abe, H Yokohama, K Asai, A Eguchi, Y Li, J Wang, XZ Li, J Liu, JP Jing, L Preda, CM Lam, C Huang, R Ye, Q Pan, HY Zhang, JJ Cai, DC Wang, Q Huang, D Wong, GLH Li, JY Kato, M Shimoda, S Furusyo, N Nakamuta, M Nomura, H Kajiwara, E Yoon, E Ahn, SB Azuma, K Dohmen, K Jung, JH Song, DS Kawano, A Koyanagi, T Ooho, A Satoh, T Takahashi, K Yeh, M-L Tsai, P-C Yasuda, S Dang, SG Li Sr., ZF Okubo, T Itokawa, N Fukunishi, S Jun, M Ishikawa, T Takaguchi, K Senoh, T Zhang, MY Zhao, CQ Tran, S Maeda, M Chuang, W-L Huang, JF Dai, C-Y Cheung, RC Buti, M Niu, JQ Xie, W Ren, H Lim, SG Wu, C Yuen, RMF Shang, J Zhu, Q Ueno, Y Tanaka, Y Hayashi, J Yu, M-L Nguyen, MH	2021
Ultrathin HfON/SiO2 dual tunneling layer for improving the electrical properties of metal-oxide–nitride-oxide-silicon memory Journal:Thin Solid Films	Liu, L Xu, J Chen, JX Ji, F HUANG, X Lai, PT	2012	53

Showing results 7 to 26 of 27 < previous next >