Showing results 1 to 9 of 9
Title | Author(s) | Issue Date | Views | |
---|---|---|---|---|
2001 | 288 | |||
A temporal approach to the Parisian risk model Journal:Journal of Applied Probability | 2018 | 22 | ||
Advisor(s):Wu, YC | 2019 | 59 | ||
2020 | 15 | |||
2009 | 261 | |||
Advisor(s):Tang, SCW | 2020 | 48 | ||
Optimization of silicon Spreading-Resistance Temperature sensor Proceeding/Conference:Proceedings of the IEEE Hong Kong Electron Devices Meeting | 2000 | 133 | ||
2017 | 229 | |||
Thin-film NTC resistor based on SrNbxTi1-xO3 Proceeding/Conference:Proceedings of the IEEE Hong Kong Electron Devices Meeting | 1999 | 100 |