Browsing by Author Li, Xiaowei

Jump to: 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
Showing results 2 to 7 of 7 < previous 
TitleAuthor(s)Issue DateViews
 
Effective apparatus for at-speed self-testing
Journal:Conference Record - IEEE Instrumentation and Measurement Technology Conference
1999
100
Effective BIST scheme for delay testing
Proceeding/Conference:Proceedings - IEEE International Symposium on Circuits and Systems
1998
107
Exploiting BIST approach for two-pattern testing
Proceeding/Conference:Proceedings of the Asian Test Symposium
1998
119
Exploiting test resource optimization in data path synthesis for BIST
Proceeding/Conference:Proceedings of the IEEE Great Lakes Symposium on VLSI
1999
108
Impact assessment of net metering on smart home cyberattack detection
Proceeding/Conference:Proceedings - Design Automation Conference
2015
 
2017
9