Browsing by Author Li, Xiaowei

Jump to: 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
Showing results 2 to 6 of 6 < previous 
TitleAuthor(s)Issue DateViews
 
Effective apparatus for at-speed self-testing
Journal:Conference Record - IEEE Instrumentation and Measurement Technology Conference
1999
38
Effective BIST scheme for delay testing
Proceeding/Conference:Proceedings - IEEE International Symposium on Circuits and Systems
1998
53
Exploiting BIST approach for two-pattern testing
Proceeding/Conference:Proceedings of the Asian Test Symposium
1998
42
Exploiting test resource optimization in data path synthesis for BIST
Proceeding/Conference:Proceedings of the IEEE Great Lakes Symposium on VLSI
1999
44
 
2017
1