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	Title	Author(s)	Issue Date
	Effects of Ge concentration on SiGe oxidation behavior Journal:Applied Physics Letters	Liou, HK Mei, P Gennser, U Yang, ES	1991
	Electrical and structural properties of shallow p + junctions formed by dual (Ga/B) ion implantation Journal:Applied Physics Letters	Mei, P Jalali, B Yang, ES Stoffel, NG Hart, DL	1990
	Picosecond photoconductive response of polycrystalline silicon thin films Journal:Applied Physics Letters	Shu, C Hu, BB Zhang, XC Mei, P Yang, ES	1990
	Structural study of tin and carbon coimplanted silicon Journal:Journal of Applied Physics	Mei, P Schmidt, MT Yang, ES Wilkens, BJ	1991

Showing results 3 to 6 of 6 < previous