Browsing by Author Sin, JKO

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TitleAuthor(s)Issue DateViews
 
High-temperature thermal sensor based on ultra-thin silicon film for ultra-low-power applications
Journal:Solid-State Electronics
Li, BWu, ZHLai, PTSin, JKOLiu, BYZheng, XR
2003
172
 
Improved Charge-Trapping Characteristics of BaTiO3 by Zr Doping for Nonvolatile Memory Applications
Journal:IEEE Electron Device Letters
Huang, XSin, JKOLai, PT
2013
24
 
Improved Charge-Trapping Characteristics of ZrO2 by Al Doping for Nonvolatile Memory Applications
Journal:IEEE Transactions on Device and Materials Reliability
HUANG, XSHI, RSin, JKOLai, PT
2016
35
 
Improved reliability for gate dielectric of low-temperature polysilicon thin-film transistors by NO-plasma nitridation
Journal:Solid-State Electronics
Or, DCTLai, PTSin, JKOXu, JP
2003
143
 
Latch-up characteristics of a trench-gate conductivity modulated power transistor
Proceeding/Conference:IEEE Region International Conference on Microelectronics and VLSI Proceedings
Jun, CSin, JKONg, WTLai, PT
1995
99
 
LaTiON/LaON as band-engineered charge-trapping layer for nonvolatile memory applications
Journal:Applied Physics A: Materials Science and Processing
Huang, XDLai, PTSin, JKO
2012
156
 
Nb-doped Ga2O3 as charge-trapping layer for nonvolatile memory applications
Journal:Microelectronics Reliability
SHI, RHuang, XDSin, JKOLai, PT
2016
45
 
Nb-doped Gd2O3 as charge-trapping layer for nonvolatile memory applications
Journal:Applied Physics Letters
SHI, RHUANG, XSin, JKOLai, PT
2015
41
 
Nb-Doped La2O3 as Charge-Trapping Layer for Nonvolatile Memory Applications
Journal:IEEE Transactions on Device and Materials Reliability
Shi, RPHuang, XDLeung, CHSin, JKOLai, PT
2015
29
 
A new high-temperature thermal sensor based on large-grain polysilicon on insulator
Journal:Sensors and Actuators, A: Physical
Wu, ZHLai, PTSin, JKO
2006
190
 
A new lateral trench-gate conductivity modulated power transistor
Journal:IEEE Transactions on Electron Devices
Cai, JSin, JKOMok, PKTNg, WTLai, PT
1999
148
 
Nitrided La2O3 as charge-trapping layer for nonvolatile memory applications
Journal:IEEE Transactions on Device and Materials Reliability
Huang, XDSin, JKOLai, PT
2012
130
 
Novel silicon-embedded coreless transformer for on-chip isolated signal transfer
Journal:IEEE Magnetics Letters
Wu, RSin, JKOHui, SY
2011
103
 
Optimization of plasma nitridation for reliability enhancement of low-temperature gate dielectric in MOS devices
Journal:Solid-State Electronics
Or, DCTLai, PTSin, JKO
2003
148
 
Optimization of silicon Spreading-Resistance Temperature sensor
Proceeding/Conference:Proceedings of the IEEE Hong Kong Electron Devices Meeting
Li, BinLai, PTChan, CLSin, JKO
2000
113
 
Performance of nonvolatile memory by using band-engineered SrTiO 3/HfON stack as charge-trapping layer
Journal:Microelectronics Reliability
Huang, XDLai, PTSin, JKO
2012
101
 
Reset-sensing quasi-V2 single-inductor multiple-output buck converter with reduced cross-regulation
Proceeding/Conference:IEEE Applied Power Electronics Conference and Exposition Conference Proceedings
Lee, ATLTan, SCHui, SYRChan, PCHSin, JKO
2015
48
 
Scalability of Quasi-hysteretic FSM-based Digitally Controlled Single-inductor Dual-string Buck LED Driver To Multiple Strings
Journal:IEEE Transactions on Power Electronics
Lee, ATLSin, JKOChan, PCH
2014
39
 
Spreading-resistance temperature sensor on silicon-on-insulator
Journal:IEEE Electron Device Letters
Lai, PTLi, BChan, CLSin, JKO
1999
98
 
Spreading-resistance temperature sensor on thin-film SOI
Proceeding/Conference:Proceedings of the IEEE Hong Kong Electron Devices Meeting
Li, BLai, PTSin, JKO
2001
100
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