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	Title	Author(s)	Issue Date	Views
	Latch-up characteristics of a trench-gate conductivity modulated power transistor Proceeding/Conference:IEEE Region International Conference on Microelectronics and VLSI Proceedings	Jun, C Sin, JKO Ng, WT Lai, PT	1995
	LaTiON/LaON as band-engineered charge-trapping layer for nonvolatile memory applications Journal:Applied Physics A: Materials Science and Processing	Huang, XD Lai, PT Sin, JKO	2012	229
	Nb-doped Ga2O3 as charge-trapping layer for nonvolatile memory applications Journal:Microelectronics Reliability	SHI, R Huang, XD Sin, JKO Lai, PT	2016	62
	Nb-doped Gd2O3 as charge-trapping layer for nonvolatile memory applications Journal:Applied Physics Letters	SHI, R HUANG, X Sin, JKO Lai, PT	2015	50
	Nb-Doped La2O3 as Charge-Trapping Layer for Nonvolatile Memory Applications Journal:IEEE Transactions on Device and Materials Reliability	Shi, RP Huang, XD Leung, CH Sin, JKO Lai, PT	2015	35
	A new high-temperature thermal sensor based on large-grain polysilicon on insulator Journal:Sensors and Actuators, A: Physical	Wu, ZH Lai, PT Sin, JKO	2006	211
	A new lateral trench-gate conductivity modulated power transistor Journal:IEEE Transactions on Electron Devices	Cai, J Sin, JKO Mok, PKT Ng, WT Lai, PT	1999
	Nitrided La2O3 as charge-trapping layer for nonvolatile memory applications Journal:IEEE Transactions on Device and Materials Reliability	Huang, XD Sin, JKO Lai, PT	2012	135
	Novel silicon-embedded coreless transformer for on-chip isolated signal transfer Journal:IEEE Magnetics Letters	Wu, R Sin, JKO Hui, SY	2011	115
	Optimization of plasma nitridation for reliability enhancement of low-temperature gate dielectric in MOS devices Journal:Solid-State Electronics	Or, DCT Lai, PT Sin, JKO	2003
	Optimization of silicon Spreading-Resistance Temperature sensor Proceeding/Conference:Proceedings of the IEEE Hong Kong Electron Devices Meeting	Li, Bin Lai, PT Chan, CL Sin, JKO	2000
	Performance of nonvolatile memory by using band-engineered SrTiO 3/HfON stack as charge-trapping layer Journal:Microelectronics Reliability	Huang, XD Lai, PT Sin, JKO	2012
	Reset-sensing quasi-V2 single-inductor multiple-output buck converter with reduced cross-regulation Proceeding/Conference:IEEE Applied Power Electronics Conference and Exposition Conference Proceedings	Lee, ATL Tan, SC Hui, SYR Chan, PCH Sin, JKO	2015	59
	Scalability of Quasi-hysteretic FSM-based Digitally Controlled Single-inductor Dual-string Buck LED Driver To Multiple Strings Journal:IEEE Transactions on Power Electronics	Lee, ATL Sin, JKO Chan, PCH	2014	44
	Spreading-resistance temperature sensor on silicon-on-insulator Journal:IEEE Electron Device Letters	Lai, PT Li, B Chan, CL Sin, JKO	1999
	Spreading-resistance temperature sensor on thin-film SOI Proceeding/Conference:Proceedings of the IEEE Hong Kong Electron Devices Meeting	Li, B Lai, PT Sin, JKO	2001	106
	Ultra-Low-Power Thermal Sensor with Silicon-On-Insulator (SOI) Structure for High-Temperature Applications Proceeding/Conference:Proceedings of IEEE Sensors	Li, B Lai, PT Sin, JKO Liu, BY Zheng, XR Wu, ZH	2002	162
	Y-Doped BaTiO3 as a Charge-Trapping Layer for Nonvolatile Memory Applications Journal:IEEE Electron Device Letters	SHI, R Huang, XD Sin, JKO Lai, PT	2016

Showing results 13 to 30 of 30 < previous