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TitleAuthor(s)Issue DateViews
 
2021
 
Gate Leakage Model of Ge MOS Capacitor with High-k Gate Dielectric
Proceeding/Conference:Proceedings of 8th ICSICT
2006
42
Gate-leakage model of Ge MOS capacitor with high-k gate dielectric
Proceeding/Conference:ICSICT-2006: 2006 8th International Conference on Solid-State and Integrated Circuit Technology, Proceedings
2007
167
 
Identification of vacancy-like defects in high-rate grown a-Si before and after ligh soaking by vepas
Proceeding/Conference:Materials Research Society Symposium Proceedings
1999
152
 
2006
216
 
2009
217
 
Improved properties of Ge MOS capacitors with HfTiON or HfTiO gate dielectric by using wet-NO ge-surface pretreatment
Proceeding/Conference:IEEE Conference on Electron Devices and Solid-State Circuits Proceedings
2008
206
 
2019
201
 
1999
148
 
2020
 
2020
Modeling of scattering at high-k dielectric/SiO2 interface of strained SiGe MOSFETs
Proceeding/Conference:ICSICT-2006: 2006 8th International Conference on Solid-State and Integrated Circuit Technology, Proceedings
2007
 
2008
 
2021
 
Optimization of Tree-like Core Overlay in Hybrid-structured Application-layer Multicast
Journal:KSII Transactions on Internet and Information Systems
2012
66
 
2020
 
2000
185
Preparation of high-quality gate dielectrics for Ge MOSFET's in wet ambients
Proceeding/Conference:Proceedings of the International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2006
2007
 
1998
 
2021
3