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Title	Author(s)	Issue Date	Views
A 2-D threshold-voltage model for small MOSFET with quantum-mechanical effects Proceeding/Conference:2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC	Xu, JP Li, YP Lai, PT Chen, WB Xu, SG	2006
A 2D threshold-voltage model for small MOSFET with quantum-mechanical effects Journal:Microelectronics Reliability	Xu, JP Li, YP Lai, PT Chen, WB Xu, SG Guan, JG	2008
B5, a thioredoxin reductase inhibitor, induces apoptosis in human cervical cancer cells by suppressing the thioredoxin system, disrupting mitochondrion-dependent pathways and triggering autophagy Journal:Oncotarget	Shao, FY Du, ZY Ma, DL Chen, WB Zhang, JX Wang, S Xiao, H Li, MM Wong, NS Liu, X Liu, QY Zhao, XD Yan, HZ Wang, YF Chen, CY Liu, Z Chen, HY	2015	106
Boosting Ultrafast Trans-Cis Photoisomerization and Intersystem Crossing in Nanocrystals of Double-Bond Photoswitching Molecules Journal:Advanced Optical Materials	Pang, JH He, JX Deng, ZQ Chen, WB Chen, SL Ni, SF Phillips, DL Dong, ZY Dang, L Li, MD	8-May-2023
Effects of different annealing gases on pentacene OTFT with HfLaO gate dielectric Proceeding/Conference:IEEE Electron Device Letters	Deng, LF Lai, PT Chen, WB Xu, JP Liu, YR Choi, HW Che, CM	2011	238
Electrical Characteristics of Ge MOS Capacitor with HfTiON as Gate Dielectric Proceeding/Conference:Proceedings of RIUPEEEC	Zou, X Li, C Xu, JP Lai, PT Chen, WB	2006	92
Electrical characteristics of MOS capacitor with HfTiON gate dielectric and HfTiSiON interlayer Journal:Chinese Physics	Chen, WB Xu, JP Lai, PT Li, YP Xu, SG Chan, CL	2006
Electrical properties and reliability of HfO 2 gate-dielectric MOS capacitors with trichloroethylene surface pretreatment Journal:Chinese Physics	Xu, JP Chen, WB Lai, PT Li, YP Chan, CL	2007	140
EM23, a natural sesquiterpene lactone, targets thioredoxin reductase to activate JNK and cell death pathways in human cervical cancer cells Journal:Oncotarget	Shao, FY Wang, S Li, HY Chen, WB Wang, GC Ma, DL Wong, NS Xiao, H Liu, QY Zhou, GX Li, YL Li, MM Wang, YF Liu, Z	2016	164
Gate leakage properties of MOS devices with tri-layer high-k gate dielectric Journal:Microelectronics Reliability	Chen, WB Xu, JP Lai, PT Li, YP Xu, SG	2007	241
Gate leakage properties of MOS devices with TriLayer high-k gate dielectric Proceeding/Conference:2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC	Chen, WB Xu, JP Lai, PT Li, YP Xu, SG	2006	90
Improved efficiency of organic photovoltaic MEH-PPV/PCBM device with CuPc-doping Proceeding/Conference:2010 IEEE International Conference of Electron Devices and Solid-State Circuits, EDSSC 2010	Chen, WB Deng, MZ Zou, HJ Li, CY Deng, LF Lai, PT	2010	133
Improved performance of low-voltage pentacene OTFTs by incorporating la to hafinium oxide gate dielectric Proceeding/Conference:2010 IEEE International Conference of Electron Devices and Solid-State Circuits, EDSSC 2010	Deng, LF Lai, PT Tao, QB Choi, HW Xu, JP Chen, WB Che, CM Liu, YR	2010
Improved performance of pentacene OTFT with HfLaO gate dielectric by annealing in NH 3 Proceeding/Conference:ECS Transactions	Deng, LF Lai, PT Xu, JP Choi, HW Chen, WB Che, CM	2010	115
Improving efficiency of organic photovoltaic cells with pentacene-doped CuPc layer Journal:Applied Physics Letters	Chen, WB Xiang, HF Xu, ZX Yan, BP Roy, VAL Che, CM Lai, PT	2007
Improving the performance of polymer solar cells by adjusting the crystallinity and nanoscale phase separation Journal:Chinese Physics B	Chen, WB Xu, ZX Li, K Chui, SSY Roy, VAL Lai, PT Che, CM	2012	56
One-Dimensional Consolidation of Multilayered Soil with Continuous Drainage Boundaries and Under Time-Dependent Loading Journal:International Journal of Geomechanics	CHEN, X Chen, WB Yue, QZQ	2022
Preparation of high-quality gate dielectrics for Ge MOSFET's in wet ambients Proceeding/Conference:Proceedings of the International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2006	Lai, PT Xu, JP Li, CX Zou, X Chen, WB	2007
Threshold voltage model of SiGe channel pMOSFET without Si cap layer Proceeding/Conference:2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC	Zou, X Li, CX Xu, JP Lai, PT Chen, WB	2006	121
A threshold-voltage model of SiGe-channel pMOSFET without Si cap layer Journal:Microelectronics Reliability	Zou, X Xu, JP Li, CX Lai, PT Chen, WB	2007	215

Showing results 1 to 20 of 20