Showing results 1 to 2 of 2
| Title | Author(s) | Issue Date | |
|---|---|---|---|
Impacts of Ti incorporation on the electrical properties and reliability of GaAs metal-oxide-semiconductor capacitors with high-k NdTiON as gate dielectric Proceeding/Conference:IEEE Semiconductor Interface Specialists Conference | 2016 | ||
Improved electrical properties of GaAs MOS capacitor by using HfLaON passivation layer Proceeding/Conference:IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) | 2016 |