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Article: On the adoption of MC/DC and control-flow adequacy for a tight integration of program testing and statistical fault localization

TitleOn the adoption of MC/DC and control-flow adequacy for a tight integration of program testing and statistical fault localization
Authors
KeywordsAdequacy criterion
Fault localization
MC/DC
Test case prioritization
Testing-debugging integration
Issue Date2013
PublisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/infsof
Citation
Information and Software Technology, 2013, v. 55 n. 5, p. 897-917 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/174182
ISSN
2020 Impact Factor: 2.73
2015 SCImago Journal Rankings: 0.920
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorJiang, B-
dc.contributor.authorZhai, K-
dc.contributor.authorChan, WK-
dc.contributor.authorTse, TH-
dc.contributor.authorZhang, Z-
dc.date.accessioned2012-11-16T03:38:40Z-
dc.date.available2012-11-16T03:38:40Z-
dc.date.issued2013-
dc.identifier.citationInformation and Software Technology, 2013, v. 55 n. 5, p. 897-917-
dc.identifier.issn0950-5849-
dc.identifier.urihttp://hdl.handle.net/10722/174182-
dc.languageeng-
dc.publisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/infsof-
dc.relation.ispartofInformation and Software Technology-
dc.rightsThis work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.-
dc.subjectAdequacy criterion-
dc.subjectFault localization-
dc.subjectMC/DC-
dc.subjectTest case prioritization-
dc.subjectTesting-debugging integration-
dc.titleOn the adoption of MC/DC and control-flow adequacy for a tight integration of program testing and statistical fault localization-
dc.typeArticle-
dc.identifier.emailChan, WK: rickchan@hkucc.hku.hk-
dc.identifier.emailTse, TH: thtse@cs.hku.hk-
dc.identifier.emailZhang, Z: zhang4zy@hku.hk-
dc.identifier.authorityTse, TH=rp00546-
dc.description.naturepostprint-
dc.identifier.doi10.1016/j.infsof.2012.10.001-
dc.identifier.scopuseid_2-s2.0-84875215650-
dc.identifier.hkuros212342-
dc.identifier.hkuros214182-
dc.identifier.volume55-
dc.identifier.issue5-
dc.identifier.spage897-
dc.identifier.epage917-
dc.identifier.isiWOS:000317327000008-
dc.publisher.placeNetherlands-
dc.identifier.issnl0950-5849-

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