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Patent History
- ApplicationDE 20016015314T 2001-04-18
- PublicationDE 60115314 2006-08-03
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published patent: Method of inspecting images to detect defects
Title | Method of inspecting images to detect defects |
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Priority Date | 2000-04-18 US 09/197708P |
Inventors | |
Issue Date | 2006 |
Citation | Germany Published Patent Application DE 60115314. Munich, Germany: The German Patent and Trade Mark Office (DPMA), 2006 How to Cite? |
Abstract | The present invention relates to a method for automated defect detection in textured materials. The present invention utilizes linear Finite Impulse Response (FIR) filters with optimized energy separation. Specifically, the invention provides a method of inspecting industrial products for defects. The method has steps of: automated design of optimized filters from samples of products, using these optimal filters to filter the acquired images of product under inspection, computing the energy of each pixel in a local region, and finally segmenting the defect by thresholding each pixel. The present invention also relates to a method of inspection of unknown (unsupervised) defects in web materials. In an unsupervised inspection, information from a finite number of optimal filters is combined using a data fusion module.; This module attempts to nullify the false alarm associated with the information arriving from different channels. |
Persistent Identifier | http://hdl.handle.net/10722/176708 |
DC Field | Value | Language |
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dc.date.accessioned | 2012-11-30T08:38:23Z | - |
dc.date.available | 2012-11-30T08:38:23Z | - |
dc.date.issued | 2006 | - |
dc.identifier.citation | Germany Published Patent Application DE 60115314. Munich, Germany: The German Patent and Trade Mark Office (DPMA), 2006 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/176708 | - |
dc.description.abstract | The present invention relates to a method for automated defect detection in textured materials. The present invention utilizes linear Finite Impulse Response (FIR) filters with optimized energy separation. Specifically, the invention provides a method of inspecting industrial products for defects. The method has steps of: automated design of optimized filters from samples of products, using these optimal filters to filter the acquired images of product under inspection, computing the energy of each pixel in a local region, and finally segmenting the defect by thresholding each pixel. The present invention also relates to a method of inspection of unknown (unsupervised) defects in web materials. In an unsupervised inspection, information from a finite number of optimal filters is combined using a data fusion module.; This module attempts to nullify the false alarm associated with the information arriving from different channels. | en_HK |
dc.title | Method of inspecting images to detect defects | en_HK |
dc.type | Patent | en_US |
dc.description.nature | published_or_final_version | en_US |
dc.contributor.inventor | Pang, GKH | en_HK |
dc.contributor.inventor | Aiay, Kumar | en_HK |
patents.identifier.application | DE 20016015314T | en_HK |
patents.description.assignee | UNIV HONG KONG [HK] | en_HK |
patents.description.country | Germany | en_HK |
patents.date.publication | 2006-08-03 | en_HK |
patents.date.application | 2001-04-18 | en_HK |
patents.date.priority | 2000-04-18 US 09/197708P | en_HK |
patents.description.cc | DE | en_HK |
patents.identifier.publication | DE 60115314 | en_HK |
patents.relation.family | CN 1335496 (A) 2002-02-13 | en_HK |
patents.relation.family | CN 100401043 (C) 2008-07-09 | en_HK |
patents.relation.family | DE 60115314 (T2) 2006-08-03 | en_HK |
patents.relation.family | EP 1148332 (A2) 2001-10-24 | en_HK |
patents.relation.family | HK 1042944 (A1) 2009-01-30 | en_HK |
patents.relation.family | US 2002054293 (A1) 2002-05-09 | en_HK |
patents.relation.family | US 6804381 (B2) 2004-10-12 | en_HK |
patents.description.kind | T2 | en_HK |
patents.type | Patent_published | en_HK |