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Conference Paper: Fabric defect detection by Fourier analysis
Title | Fabric defect detection by Fourier analysis |
---|---|
Authors | |
Keywords | Engineering Electrical engineering |
Issue Date | 1999 |
Publisher | IEEE. |
Citation | The 34th IEEE - IAS Annual Meeting Conference, Phoenix, AZ., 3-7 October 1999. In Industry Applications Society. IEEE - IAS Annual Meeting Conference Record, 1999, v. 3, p. 1743-1750 How to Cite? |
Abstract | Many fabric defects are very small and undistinguishable, which are very difficult to detect by only monitoring the intensity change. Faultless fabric is a repetitive and regular global texture and Fourier transform can be applied to monitor the spatial frequency spectrum of a fabric. When a defect occurs in fabric, its regular structure is changed so that the corresponding intensity at some specific positions of the frequency spectrum would change. However, the three-dimensional frequency spectrum is very difficult to analyze. In this paper, a simulated fabric model is used to understand the relationship between the fabric structure in the image space and in the frequency space. Based on the three-dimensional frequency spectrum, two significant spectrum diagrams are defined and used for analyzing the fabric defect. These two diagrams are called the central spatial frequency spectrums. The defects are broadly classified into four classes: (1) double yarn; (2) missing yarn; (3) webs or broken fabric; and (4) yarn densities variation. After evaluating these four classes of defects using some simulated models and real samples, seven characteristic parameters for central spatial frequency spectrum are extracted for defect classification. |
Persistent Identifier | http://hdl.handle.net/10722/46161 |
ISSN | 2023 SCImago Journal Rankings: 0.422 |
References |
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chan, CH | en_HK |
dc.contributor.author | Pang, GKH | en_HK |
dc.date.accessioned | 2007-10-30T06:43:49Z | - |
dc.date.available | 2007-10-30T06:43:49Z | - |
dc.date.issued | 1999 | en_HK |
dc.identifier.citation | The 34th IEEE - IAS Annual Meeting Conference, Phoenix, AZ., 3-7 October 1999. In Industry Applications Society. IEEE - IAS Annual Meeting Conference Record, 1999, v. 3, p. 1743-1750 | en_HK |
dc.identifier.issn | 0197-2618 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/46161 | - |
dc.description.abstract | Many fabric defects are very small and undistinguishable, which are very difficult to detect by only monitoring the intensity change. Faultless fabric is a repetitive and regular global texture and Fourier transform can be applied to monitor the spatial frequency spectrum of a fabric. When a defect occurs in fabric, its regular structure is changed so that the corresponding intensity at some specific positions of the frequency spectrum would change. However, the three-dimensional frequency spectrum is very difficult to analyze. In this paper, a simulated fabric model is used to understand the relationship between the fabric structure in the image space and in the frequency space. Based on the three-dimensional frequency spectrum, two significant spectrum diagrams are defined and used for analyzing the fabric defect. These two diagrams are called the central spatial frequency spectrums. The defects are broadly classified into four classes: (1) double yarn; (2) missing yarn; (3) webs or broken fabric; and (4) yarn densities variation. After evaluating these four classes of defects using some simulated models and real samples, seven characteristic parameters for central spatial frequency spectrum are extracted for defect classification. | en_HK |
dc.language | eng | en_HK |
dc.publisher | IEEE. | en_HK |
dc.relation.ispartof | Industry Applications Society. IEEE - IAS Annual Meeting Conference Record | - |
dc.rights | ©1999 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. | - |
dc.subject | Engineering | en_HK |
dc.subject | Electrical engineering | en_HK |
dc.title | Fabric defect detection by Fourier analysis | en_HK |
dc.type | Conference_Paper | en_HK |
dc.identifier.openurl | http://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0197-2618&volume=3&spage=1743&epage=1750&date=1999&atitle=Fabric+defect+detection+by+Fourier+analysis | en_HK |
dc.identifier.email | Pang, Grantham: gpang@eee.hku.hk | - |
dc.identifier.email | Pang, Grantham: gpang@eee.hku.hk | - |
dc.identifier.authority | Pang, Grantham=rp00162 | - |
dc.description.nature | published_or_final_version | en_HK |
dc.identifier.doi | 10.1109/IAS.1999.805975 | en_HK |
dc.identifier.scopus | eid_2-s2.0-0033343403 | - |
dc.identifier.hkuros | 50482 | - |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-0033343403&selection=ref&src=s&origin=recordpage | - |
dc.identifier.volume | 3 | - |
dc.identifier.spage | 1743 | - |
dc.identifier.epage | 1750 | - |
dc.publisher.place | United States | - |
dc.identifier.scopusauthorid | Chan, Chiho=7404813577 | - |
dc.identifier.scopusauthorid | Pang, Grantham=7103393283 | - |
dc.customcontrol.immutable | sml 160112 - merged | - |
dc.identifier.issnl | 0197-2618 | - |